Measurement of the CKM matrix element $\left|V_{cb}\right|$ from $B^0\to D^{*-}{\ell }^{+}{\nu }_{\ell }$ at Belle

Journal Article · Wed Sep 11 00:00:00 EDT 2019 · Physical Review. D.

DOI:https://doi.org/10.1103/PhysRevD.100.052007· OSTI ID:1561335

Waheed, E.; Urquijo, P.; Ferlewicz, D.; Adachi, I.; Adamczyk, K.; Aihara, H.; Al Said, S.; Asner, D. M.; Atmacan, H.; Aushev, T.; Ayad, R.; Babu, V.; Badhrees, I.; Bansal, V.; Behera, P.; Beleño, C.; Bernlochner, F.; Bhuyan, B.; Bilka, T.; Biswal, J. ; Bobrov, A.; Bonvicini, G.; Bozek, A.; Bračko, M.; Browder, T. E.; Campajola, M.; Červenkov, D.; Chang, P.; Chekelian, V.; Chen, A.; Cheon, B. G.; Chilikin, K.; Cho, H. E.; Cho, K.; Choi, S. -K.; Choi, Y.; Choudhury, S.; Cinabro, D.; Cunliffe, S.; Di Carlo, S.; Doležal, Z.; Dong, T. V.; Dossett, D.; Eidelman, S.; Epifanov, D.; Fast, J. E.; Fulsom, B. G.; Garg, R.; Gaur, V.; Garmash, A.; Giri, A.; Goldenzweig, P.; Golob, B.; Grzymkowska, O.; Haba, J.; Hara, T.; Hayasaka, K.; Hayashii, H.; Hedges, M. T.; Hou, W. -S.; Hsu, C. -L.; Iijima, T.; Inami, K.; Inguglia, G.; Ishikawa, A.; Iwasaki, M.; Iwasaki, Y.; Jacobs, W. W.; Jeon, H. B.; Jia, S.; Jin, Y.; Joffe, D.; Joo, K. K.; Kahn, J.; Kaliyar, A. B.; Karyan, G.; Kawasaki, T.; Kim, C. H.; Kim, D. Y.; Kim, K. T.; Kim, S. H.; Kinoshita, K.; Kodyš, P.; Korpar, S.; Kotchetkov, D.; Križan, P.; Kroeger, R.; Krokovny, P.; Kuhr, T.; Kulasiri, R.; Kuzmin, A.; Kwon, Y. -J.; Lange, J. S.; Lee, J. Y.; Lee, S. C.; Li, C. H.; Li, L. K.; Li, Y. B.; Li Gioi, L.; Libby, J.; Lieret, K.; Liventsev, D.; Lu, P. -C.; Luo, T.; MacNaughton, J.; Masuda, M.; Matvienko, D.; Merola, M.; Metzner, F.; Miyabayashi, K.; Miyata, H.; Mizuk, R.; Mohanty, G. B.; Mori, T.; Mussa, R.; Nakamura, I.; Nakao, M.; Nath, K. J.; Natkaniec, Z.; Nayak, M.; Niiyama, M.; Nisar, N. K.; Nishida, S.; Nishimura, K.; Ogawa, S.; Ono, H.; Pakhlov, P.; Pakhlova, G.; Pal, B.; Pardi, S.; Park, H.; Park, S. -H.; Paul, S.; Pestotnik, R.; Piilonen, L. E.; Popov, V.; Prencipe, E.; Prim, M.; Rostomyan, A.; Russo, G.; Sakai, Y.; Salehi, M.; Sandilya, S.; Sanuki, T.; Savinov, V.; Schneider, O.; Schnell, G.; Schueler, J.; Schwanda, C.; Seino, Y.; Senyo, K.; Seon, O.; Sevior, M. E.; Shebalin, V.; Shen, C. P.; Shiu, J. -G.; Shwartz, B.; Simon, F.; Sokolov, A.; Solovieva, E.; Stanič, S.; Starič, M.; Stottler, Z. S.; Strube, J. F.; Sumiyoshi, T.; Takizawa, M.; Tanida, K.; Tenchini, F.; Trabelsi, K.; Uchida, M.; Uglov, T.; Unno, Y.; Uno, S.; Usov, Y.; Varner, G.; Varvell, K. E.; Vinokurova, A.; Vossen, A.; Wang, C. H.; Wang, M. -Z.; Wang, P.; Won, E.; Yang, S. B.; Ye, H.; Yusa, Y.; Zhang, Z. P.; Zhilich, V.; Zhukova, V.

We present a new measurement of the Cabibbo-Kobayashi-Maskawa matrix element $\left|V_{cb}\right|$ from $B^0\to D^{*-}{\ell }^{+}{\nu }_{\ell }$ decays, reconstructed with the full Belle data set of $711{\mathrm{fb}}^{-1}$ integrated luminosity. Two form factor parametrizations, originally conceived by the Caprini-Lellouch-Neubert (CLN) and the Boyd, Grinstein and Lebed (BGL) groups, are used to extract the product $\mathcal{F}\left(1\right){\eta }_{\mathrm{EW}}\left|V_{cb}\right|$ and the decay form factors, where $\mathcal{F}\left(1\right)$ is the normalization factor and ${\eta }_{\mathrm{EW}}$ is a small electroweak correction. In the CLN parametrization we find $\mathcal{F}\left(1\right){\eta }_{\mathrm{EW}}\left|V_{cb}\right|=(35.06\pm 0.15\pm 0.56)\times {10}^{-3}$, ${\rho }^2=1.106\pm 0.031\pm 0.007$, $R_1\left(1\right)=1.229\pm 0.028\pm 0.009$, $R_2\left(1\right)=0.852\pm 0.021\pm 0.006$. For the BGL parametrization we obtain $\mathcal{F}\left(1\right){\eta }_{\mathrm{EW}}\left|V_{cb}\right|=(34.93\pm 0.23\pm 0.59)\times {10}^{-3}$, which is consistent with the world average when correcting for $\mathcal{F}\left(1\right){\eta }_{\mathrm{EW}}$. The branching fraction of $B^0\to D^{*-}{\ell }^{+}{\nu }_{\ell }$ is measured to be $\mathcal{B}(B^0\to D^{*-}{\ell }^{+}{\nu }_{\ell })=(4.90\pm 0.02\pm 0.16)\%$. We also present a new test of lepton flavor universality violation in semileptonic $B$ decays, $\frac{\mathcal{B}(B^0\to D^{*-}{e}^{+}\nu )}{\mathcal{B}(B^0\to D^{*-}{\mu }^{+}\nu )}=1.01\pm 0.01\pm 0.03$. The errors quoted correspond to the statistical and systematic uncertainties, respectively. This is the most precise measurement of $\mathcal{F}\left(1\right){\eta }_{\mathrm{EW}}\left|V_{cb}\right|$ and form factors to date and the first experimental study of the BGL form factor parametrization in an experimental measurement.

• Research Organization: Brookhaven National Laboratory (BNL), Upton, NY (United States); Virginia Polytechnic Inst. and State Univ. (Virginia Tech), Blacksburg, VA (United States); Univ. of Hawaii, Honolulu, HI (United States)
• Sponsoring Organization: USDOE Office of Science (SC), High Energy Physics (HEP); National Science Foundation (NSF); KEK - High Energy Accelerator Research Organization; Ministry of Education, Culture, Sports, Science and Technology
• Contributing Organization: Belle Collaboration
• Grant/Contract Number: SC0012704; SC0009973; SC0010504
• OSTI ID: 1561335
• Alternate ID(s): OSTI ID: 1569556; OSTI ID: 1593772; OSTI ID: 1787816
• Report Number(s): BNL-212157-2019-JAAM; BNL-221639-2021-JAAM; PRVDAQ; 052007
• Journal Information: Physical Review. D., Journal Name: Physical Review. D. Vol. 100 Journal Issue: 5; ISSN 2470-0010
• Publisher: American Physical Society (APS)
• Country of Publication: United States
• Language: English

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