Accelerated Stress Testing Results on Single-Channel and Multichannel Drivers (Final Report)
- RTI Internationa, Research Triangel, PK (United States)
Drivers used to operate light-emitting diode (LED) loads form an integral part of the solid-state lighting (SSL) system. While understanding of LED failure modes such as luminous flux depreciation and chromaticity shifts has increased greatly over the past five years, there is still much uncertainty about general failure modes in SSL drivers due to the almost infinite variety of driver typologies. This report, which is the third in a series of three reports on driver robustness, summarizes overall findings from up to 7,500 hours of accelerated stress testing (AST) on two-stage SSL drivers that could be used to operate troffers and similar fixtures. The earlier reports in this series provided initial AST results for both single-channel and multichannel drivers [1] and an interim update on the performance of multichannel drivers in AST [2].
- Research Organization:
- RTI International
- Sponsoring Organization:
- USDOE Office of Energy Efficiency and Renewable Energy (EERE), Energy Efficiency Office. Building Technologies Office
- OSTI ID:
- 1559875
- Report Number(s):
- DOE/EE-1973; 8126
- Country of Publication:
- United States
- Language:
- English
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