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Title: Correlating dynamic strain and photoluminescence of solid-state defects with stroboscopic x-ray diffraction microscopy

Abstract

Control of local lattice perturbations near optically-active defects in semiconductors is a key step to harnessing the potential of solid-state qubits for quantum information science and nanoscale sensing. We report the development of a stroboscopic scanning X-ray diffraction microscopy approach for real-space imaging of dynamic strain used in correlation with microscopic photoluminescence measurements. We demonstrate this technique in 4H-SiC, which hosts long-lifetime room temperature vacancy spin defects. Using nano-focused X-ray photon pulses synchronized to a surface acoustic wave launcher, we achieve an effective time resolution of similar to 100 ps at a 25 nm spatial resolution to map micro-radian dynamic lattice curvatures. The acoustically induced lattice distortions near an engineered scattering structure are correlated with enhanced photoluminescence responses of optically-active SiC quantum defects driven by local piezoelectric effects. These results demonstrate a unique route for directly imaging local strain in nanomechanical structures and quantifying dynamic structure-function relationships in materials under realistic operating conditions.

Authors:
; ; ; ;
Publication Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org.:
USDOE Office of Science - Office of Basic Energy Sciences - Materials Sciences and Engineering Division; Air Force Research Laboratory (AFRL) - Air Force Office of Scientific Research (AFOSR)
OSTI Identifier:
1557252
DOE Contract Number:  
AC02-06CH11357
Resource Type:
Journal Article
Journal Name:
Nature Communications
Additional Journal Information:
Journal Volume: 10
Country of Publication:
United States
Language:
English

Citation Formats

Whiteley, S. J., Heremans, F. J., Wolfowicz, G., Awschalom, D. D., and Holt, M. V. Correlating dynamic strain and photoluminescence of solid-state defects with stroboscopic x-ray diffraction microscopy. United States: N. p., 2019. Web. doi:10.1038/s41467-019-11365-9.
Whiteley, S. J., Heremans, F. J., Wolfowicz, G., Awschalom, D. D., & Holt, M. V. Correlating dynamic strain and photoluminescence of solid-state defects with stroboscopic x-ray diffraction microscopy. United States. doi:10.1038/s41467-019-11365-9.
Whiteley, S. J., Heremans, F. J., Wolfowicz, G., Awschalom, D. D., and Holt, M. V. Mon . "Correlating dynamic strain and photoluminescence of solid-state defects with stroboscopic x-ray diffraction microscopy". United States. doi:10.1038/s41467-019-11365-9.
@article{osti_1557252,
title = {Correlating dynamic strain and photoluminescence of solid-state defects with stroboscopic x-ray diffraction microscopy},
author = {Whiteley, S. J. and Heremans, F. J. and Wolfowicz, G. and Awschalom, D. D. and Holt, M. V.},
abstractNote = {Control of local lattice perturbations near optically-active defects in semiconductors is a key step to harnessing the potential of solid-state qubits for quantum information science and nanoscale sensing. We report the development of a stroboscopic scanning X-ray diffraction microscopy approach for real-space imaging of dynamic strain used in correlation with microscopic photoluminescence measurements. We demonstrate this technique in 4H-SiC, which hosts long-lifetime room temperature vacancy spin defects. Using nano-focused X-ray photon pulses synchronized to a surface acoustic wave launcher, we achieve an effective time resolution of similar to 100 ps at a 25 nm spatial resolution to map micro-radian dynamic lattice curvatures. The acoustically induced lattice distortions near an engineered scattering structure are correlated with enhanced photoluminescence responses of optically-active SiC quantum defects driven by local piezoelectric effects. These results demonstrate a unique route for directly imaging local strain in nanomechanical structures and quantifying dynamic structure-function relationships in materials under realistic operating conditions.},
doi = {10.1038/s41467-019-11365-9},
journal = {Nature Communications},
number = ,
volume = 10,
place = {United States},
year = {2019},
month = {7}
}