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Title: Extended Electronic Structure Inhomogeneity Created by Double Chain Layer Defects Surrounding Columnar Tracks in Heavy-Ion Irradiated YBa{sub 2}Cu{sub 3}O{sub 7-{delta}}.

Abstract

In YBa2Cu3O7-delta (YBCO), heavy-ion irradiation creates continuous amorphous tracks that are highly effective for vortex pinning. However, the electronic structure landscape of defects and consequently their vortex pinning roles are unclear. Here, we show double chain layer (DCL) defects which intersect the columnar tracks are additionally produced by high energy Pb ion irradiation in YBCO. The DCL defects are similar to 29 nm long, about three times the columnar defect diameter. The electronic structures of the DCL and columnar track defects were determined using atomic-resolution scanning transmission electron microscopy (STEM) and high resolution electron energy loss spectroscopy (EELS). Results show a decrease in the oxygen and copper content at the interface between the track and the YBCO matrix, resulting in interfacial strain. For the DCL defects, the STEM/EELS study revealed a localized electron doped CuO2 plane next to the DCL defect. The DCL defects thus further extend the electronic inhomogeneity into YBCO.

Authors:
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Publication Date:
Research Org.:
Energy Frontier Research Centers (EFRC) (United States). Center for Emergent Superconductivity (CES); Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org.:
USDOE Office of Science - Energy Frontier Research Center - Center for Emergent Superconductivity; USDOE Office of Science - Office of Basic Energy Sciences - Materials Sciences and Engineering Division
OSTI Identifier:
1548290
DOE Contract Number:  
AC02-06CH11357
Resource Type:
Journal Article
Journal Name:
Superconductor Science and Technology
Additional Journal Information:
Journal Volume: 31; Journal Issue: 10
Country of Publication:
United States
Language:
English
Subject:
critical current; double chain layer defect; electron energy loss spectroscopy; high temperature superconductor; scanning transmission electron microscopy

Citation Formats

Kwon, Ji-Hwan, Meng, Yifei, Wu, Lijun, Zhu, Yimei, Zhang, Yifei, Selvamanickam, Venkat, Welp, Ulrich, Kwok, Wai-Kwong, and Zuo, Jian-Min. Extended Electronic Structure Inhomogeneity Created by Double Chain Layer Defects Surrounding Columnar Tracks in Heavy-Ion Irradiated YBa{sub 2}Cu{sub 3}O{sub 7-{delta}}.. United States: N. p., 2018. Web. doi:10.1088/1361-6668/aad842.
Kwon, Ji-Hwan, Meng, Yifei, Wu, Lijun, Zhu, Yimei, Zhang, Yifei, Selvamanickam, Venkat, Welp, Ulrich, Kwok, Wai-Kwong, & Zuo, Jian-Min. Extended Electronic Structure Inhomogeneity Created by Double Chain Layer Defects Surrounding Columnar Tracks in Heavy-Ion Irradiated YBa{sub 2}Cu{sub 3}O{sub 7-{delta}}.. United States. doi:10.1088/1361-6668/aad842.
Kwon, Ji-Hwan, Meng, Yifei, Wu, Lijun, Zhu, Yimei, Zhang, Yifei, Selvamanickam, Venkat, Welp, Ulrich, Kwok, Wai-Kwong, and Zuo, Jian-Min. Mon . "Extended Electronic Structure Inhomogeneity Created by Double Chain Layer Defects Surrounding Columnar Tracks in Heavy-Ion Irradiated YBa{sub 2}Cu{sub 3}O{sub 7-{delta}}.". United States. doi:10.1088/1361-6668/aad842.
@article{osti_1548290,
title = {Extended Electronic Structure Inhomogeneity Created by Double Chain Layer Defects Surrounding Columnar Tracks in Heavy-Ion Irradiated YBa{sub 2}Cu{sub 3}O{sub 7-{delta}}.},
author = {Kwon, Ji-Hwan and Meng, Yifei and Wu, Lijun and Zhu, Yimei and Zhang, Yifei and Selvamanickam, Venkat and Welp, Ulrich and Kwok, Wai-Kwong and Zuo, Jian-Min},
abstractNote = {In YBa2Cu3O7-delta (YBCO), heavy-ion irradiation creates continuous amorphous tracks that are highly effective for vortex pinning. However, the electronic structure landscape of defects and consequently their vortex pinning roles are unclear. Here, we show double chain layer (DCL) defects which intersect the columnar tracks are additionally produced by high energy Pb ion irradiation in YBCO. The DCL defects are similar to 29 nm long, about three times the columnar defect diameter. The electronic structures of the DCL and columnar track defects were determined using atomic-resolution scanning transmission electron microscopy (STEM) and high resolution electron energy loss spectroscopy (EELS). Results show a decrease in the oxygen and copper content at the interface between the track and the YBCO matrix, resulting in interfacial strain. For the DCL defects, the STEM/EELS study revealed a localized electron doped CuO2 plane next to the DCL defect. The DCL defects thus further extend the electronic inhomogeneity into YBCO.},
doi = {10.1088/1361-6668/aad842},
journal = {Superconductor Science and Technology},
number = 10,
volume = 31,
place = {United States},
year = {2018},
month = {10}
}

Works referenced in this record:

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