Bulk and surface plasmons in solids
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journal
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May 1995 |
Optical absorption and emission of silicon nanocrystals: From single to collective response
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April 2013 |
Statistical- and image-noise effects on experimental spectrum of line-edge and line-width roughness
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journal
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October 2010 |
Discrete power spectrum of line width roughness
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journal
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October 2009 |
Theoretical analysis of line-edge roughness using FFT techniques
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conference
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June 1999 |
From active plasmonic devices to plasmonic molecular electronics
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journal
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October 2018 |
Line shape of the volume plasmons of silicon and germanium
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journal
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April 1979 |
I n s i t u vaporization of very low molecular weight resists using 1/2 nm diameter electron beams
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November 1981 |
Approaching the Resolution Limit of Nanometer-Scale Electron Beam-Induced Deposition
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journal
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July 2005 |
A single-atom transistor
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February 2012 |
About the influence of Line Edge Roughness on measured effective–CD
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January 2011 |
Unbiased line width roughness measurements with critical dimension scanning electron microscopy and critical dimension atomic force microscopy
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journal
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April 2012 |
Mechanistic Studies of Plasmon Chemistry on Metal Catalysts
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journal
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February 2019 |
Sub-50-nm self-assembled nanotextures for enhanced broadband antireflection in silicon solar cells
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journal
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January 2015 |
Nanostructured metals for light-based technologies
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journal
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March 2019 |
Chemically Enhancing Block Copolymers for Block-Selective Synthesis of Self-Assembled Metal Oxide Nanostructures
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journal
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December 2012 |
Surface plasmons and breakdown in thin silicon dioxide films on silicon
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journal
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August 1998 |
Emerging nanofabrication and quantum confinement techniques for 2D materials beyond graphene
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July 2018 |
Optical properties of nanostructured materials: a review
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journal
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January 2011 |
Intrinsic parameter fluctuations in decananometer mosfets introduced by gate line edge roughness
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journal
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May 2003 |
Probing Nanoparticle Plasmons with Electron Energy Loss Spectroscopy
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journal
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December 2017 |
Large-Area Metal Gaps and Their Optical Applications
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journal
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August 2018 |
Ab initio energy loss spectra of Si and Ge nanowires
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journal
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January 2015 |
Low-Magnetic-Field Regime of a Gate-Defined Constriction in High-Mobility Graphene
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journal
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January 2019 |
Electron Energy-Loss Spectroscopy in the Electron Microscope
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book
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January 2011 |
Aberration-Corrected Electron Beam Lithography at the One Nanometer Length Scale
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journal
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April 2017 |
Determination of line edge roughness in low-dose top-down scanning electron microscopy images
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journal
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July 2014 |
High-Yield, Ultrafast, Surface Plasmon-Enhanced, Au Nanorod Optical Field Electron Emitter Arrays
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journal
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November 2014 |
Atomic precision lithography on Si
- Randall, J. N.; Lyding, J. W.; Schmucker, S.
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Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, Vol. 27, Issue 6
https://doi.org/10.1116/1.3237096
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journal
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January 2009 |
Systematic errors in the measurement of power spectral density
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journal
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July 2013 |
From Si Nanowires to Porous Silicon: The Role of Excitonic Effects
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journal
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January 2007 |
Nonlocal effects in the plasmons of nanowires and nanocavities excited by fast electron beams
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journal
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July 2008 |
Resolution Limits of Electron-Beam Lithography toward the Atomic Scale
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journal
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March 2013 |
Atom-by-Atom Construction of a Cyclic Artificial Molecule in Silicon
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journal
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November 2018 |
High-Energy Surface and Volume Plasmons in Nanopatterned Sub-10 nm Aluminum Nanostructures
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journal
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June 2016 |
Using high-contrast salty development of hydrogen silsesquioxane for sub-10-nm half-pitch lithography
- Yang, Joel K. W.; Berggren, Karl K.
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Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, Vol. 25, Issue 6
https://doi.org/10.1116/1.2801881
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journal
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January 2007 |
Mechanistic Studies of Plasmon Chemistry on Metal Catalysts
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journal
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April 2019 |
Systematic errors in the measurement of power spectral density
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conference
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April 2013 |
Determination of line edge roughness in low dose top-down scanning electron microscopy images
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conference
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April 2014 |
Low Magnetic Field Regime of a Gate-Defined Constriction in High-Mobility Graphene
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text
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January 2018 |