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Title: Measurements of the effective electron density in an electron beam ion trap using extreme ultraviolet spectra and optical imaging

Journal Article · · Review of Scientific Instruments
DOI:https://doi.org/10.1063/1.5036758· OSTI ID:1545370
ORCiD logo [1]; ORCiD logo [2];  [2];  [1];  [2];  [2]; ORCiD logo [1]
  1. Columbia Astrophysics Lab, New York, NY (United States)
  2. Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
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In an electron beam ion trap (EBIT), the ions are not confined to the electron beam, but rather oscillate in and out of the beam. As a result, the ions do not continuously experience the full density of the electron beam. To determine the effective electron density, ne,eff, experienced by the ions, the electron beam size, the nominal electron density ne, and the ion distribution around the beam, i.e., the so-called ion cloud, must be measured. We use imaging techniques in the extreme ultraviolet (EUV) and optical to determine these. The electron beam width is measured using 3d → 3p emission from Fe xii and xiii between 185 and 205 Å. These transitions are fast and the EUV emission occurs only within the electron beam. The measured spatial emission profile and variable electron current yield a nominal electron density range of ne ~ 1011–1013 cm–3. We determine the size of the ion cloud using optical emission from metastable levels of ions with radiative lifetimes longer than the ion orbital periods. Here, the resulting emission maps out the spatial distribution of the ion cloud. We find a typical electron beam radius of ~60 μm and an ion cloud radius of ~300 μm. These yield a spatially averaged effective electron density, ne,eff, experienced by the ions in EBIT spanning ~ 5 × 109–5 × 1011 cm–3.

Research Organization:
Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
Sponsoring Organization:
USDOE Office of Science (SC)
Grant/Contract Number:
NNX16AF10G; AC52-07NA27344
OSTI ID:
1545370
Alternate ID(s):
OSTI ID: 1478438
Journal Information:
Review of Scientific Instruments, Vol. 89, Issue 10; ISSN 0034-6748
Publisher:
American Institute of Physics (AIP)Copyright Statement
Country of Publication:
United States
Language:
English
Citation Metrics:
Cited by: 5 works
Citation information provided by
Web of Science

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Cited By (1)

Experimental comparison of spherically bent HAPG and Ge crystals journal October 2018

Figures / Tables (6)

FIG. 1(p. 3)figure FIG. 1
FIG. 2(p. 4)figure FIG. 2
FIG. 3(p. 4)figure FIG. 3
FIG. 4(p. 4)figure FIG. 4
FIG. 5(p. 4)figure FIG. 5
FIG. 6(p. 5)figure FIG. 6

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