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Title: Molecular basis for damage recognition and verification by XPC-RAD23B and TFIIH in nucleotide excision repair

Abstract

Not provided.

Authors:
; ; ; ;
Publication Date:
Research Org.:
Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States). National Energy Research Scientific Computing Center (NERSC)
Sponsoring Org.:
USDOE
OSTI Identifier:
1543540
DOE Contract Number:  
AC02-05CH11231
Resource Type:
Journal Article
Journal Name:
DNA Repair
Additional Journal Information:
Journal Volume: 71; Journal Issue: C; Journal ID: ISSN 1568-7864
Publisher:
Elsevier
Country of Publication:
United States
Language:
English
Subject:
Genetics & Heredity; Toxicology

Citation Formats

Mu, Hong, Geacintov, Nicholas E., Broyde, Suse, Yeo, Jung-Eun, and Schärer, Orlando D. Molecular basis for damage recognition and verification by XPC-RAD23B and TFIIH in nucleotide excision repair. United States: N. p., 2018. Web. doi:10.1016/j.dnarep.2018.08.005.
Mu, Hong, Geacintov, Nicholas E., Broyde, Suse, Yeo, Jung-Eun, & Schärer, Orlando D. Molecular basis for damage recognition and verification by XPC-RAD23B and TFIIH in nucleotide excision repair. United States. doi:10.1016/j.dnarep.2018.08.005.
Mu, Hong, Geacintov, Nicholas E., Broyde, Suse, Yeo, Jung-Eun, and Schärer, Orlando D. Thu . "Molecular basis for damage recognition and verification by XPC-RAD23B and TFIIH in nucleotide excision repair". United States. doi:10.1016/j.dnarep.2018.08.005.
@article{osti_1543540,
title = {Molecular basis for damage recognition and verification by XPC-RAD23B and TFIIH in nucleotide excision repair},
author = {Mu, Hong and Geacintov, Nicholas E. and Broyde, Suse and Yeo, Jung-Eun and Schärer, Orlando D.},
abstractNote = {Not provided.},
doi = {10.1016/j.dnarep.2018.08.005},
journal = {DNA Repair},
issn = {1568-7864},
number = C,
volume = 71,
place = {United States},
year = {2018},
month = {11}
}