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Title: Self-Contained Fragmentation and Interfacial Stability in Crude Micron-Silicon Anodes

Abstract

Not provided.

Authors:
; ; ; ; ; ;
Publication Date:
Research Org.:
SilLion, Inc., Broomfield, CO (United States)
Sponsoring Org.:
USDOE Office of Science (SC)
OSTI Identifier:
1541797
DOE Contract Number:  
SC0013852
Resource Type:
Journal Article
Journal Name:
Journal of the Electrochemical Society
Additional Journal Information:
Journal Volume: 165; Journal Issue: 2; Journal ID: ISSN 0013-4651
Publisher:
The Electrochemical Society
Country of Publication:
United States
Language:
English
Subject:
Electrochemistry; Materials Science

Citation Formats

Heist, Ashley, Piper, Daniela Molina, Evans, Tyler, Kim, Seul Cham, Han, Sang Sub, Oh, Kyu Hwan, and Lee, Se-Hee. Self-Contained Fragmentation and Interfacial Stability in Crude Micron-Silicon Anodes. United States: N. p., 2018. Web. doi:10.1149/2.0811802jes.
Heist, Ashley, Piper, Daniela Molina, Evans, Tyler, Kim, Seul Cham, Han, Sang Sub, Oh, Kyu Hwan, & Lee, Se-Hee. Self-Contained Fragmentation and Interfacial Stability in Crude Micron-Silicon Anodes. United States. doi:10.1149/2.0811802jes.
Heist, Ashley, Piper, Daniela Molina, Evans, Tyler, Kim, Seul Cham, Han, Sang Sub, Oh, Kyu Hwan, and Lee, Se-Hee. Mon . "Self-Contained Fragmentation and Interfacial Stability in Crude Micron-Silicon Anodes". United States. doi:10.1149/2.0811802jes.
@article{osti_1541797,
title = {Self-Contained Fragmentation and Interfacial Stability in Crude Micron-Silicon Anodes},
author = {Heist, Ashley and Piper, Daniela Molina and Evans, Tyler and Kim, Seul Cham and Han, Sang Sub and Oh, Kyu Hwan and Lee, Se-Hee},
abstractNote = {Not provided.},
doi = {10.1149/2.0811802jes},
journal = {Journal of the Electrochemical Society},
issn = {0013-4651},
number = 2,
volume = 165,
place = {United States},
year = {2018},
month = {1}
}

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