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Title: Thermal adsorption-enhanced atomic layer etching of Si 3 N 4

Journal Article · · Journal of Vacuum Science and Technology. A, Vacuum, Surfaces and Films
DOI:https://doi.org/10.1116/1.5003271· OSTI ID:1541660
 [1];  [2];  [2];  [2];  [2];  [2];  [3]
  1. Department of Chemical Engineering, Stanford University, 443 Via Ortega, Stanford, California 94305 and Division of Advanced Materials Engineering, Chonbuk National University, Jeonbuk 54896, South Korea
  2. Samsung Electronics, Manufacturing Technology Center, San 1-1 Banwol-Dong, Hwasung-Si, Gyeonggi-Do 445-330, South Korea
  3. Department of Chemical Engineering, Stanford University, 443 Via Ortega, Stanford, California 94305

Not provided.

Research Organization:
Stanford Univ., CA (United States)
Sponsoring Organization:
USDOE Office of Science (SC)
DOE Contract Number:
SC0004782
OSTI ID:
1541660
Journal Information:
Journal of Vacuum Science and Technology. A, Vacuum, Surfaces and Films, Vol. 36, Issue 1; ISSN 0734-2101
Publisher:
American Vacuum Society
Country of Publication:
United States
Language:
English

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