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Title: Stuck-at Fault Tolerance in RRAM Computing Systems

Abstract

Not provided.

Authors:
ORCiD logo; ; ; ; ; ORCiD logo; ORCiD logo;
Publication Date:
Research Org.:
Univ. of California, Santa Barbara, CA (United States)
Sponsoring Org.:
USDOE Office of Science (SC)
OSTI Identifier:
1541450
DOE Contract Number:  
SC0013553
Resource Type:
Journal Article
Journal Name:
IEEE Journal on Emerging and Selected Topics in Circuits and Systems
Additional Journal Information:
Journal Volume: 8; Journal Issue: 1; Journal ID: ISSN 2156-3357
Publisher:
IEEE
Country of Publication:
United States
Language:
English
Subject:
Engineering

Citation Formats

Xia, Lixue, Huangfu, Wenqin, Tang, Tianqi, Yin, Xiling, Chakrabarty, Krishnendu, Xie, Yuan, Wang, Yu, and Yang, Huazhong. Stuck-at Fault Tolerance in RRAM Computing Systems. United States: N. p., 2018. Web. doi:10.1109/jetcas.2017.2776980.
Xia, Lixue, Huangfu, Wenqin, Tang, Tianqi, Yin, Xiling, Chakrabarty, Krishnendu, Xie, Yuan, Wang, Yu, & Yang, Huazhong. Stuck-at Fault Tolerance in RRAM Computing Systems. United States. doi:10.1109/jetcas.2017.2776980.
Xia, Lixue, Huangfu, Wenqin, Tang, Tianqi, Yin, Xiling, Chakrabarty, Krishnendu, Xie, Yuan, Wang, Yu, and Yang, Huazhong. Thu . "Stuck-at Fault Tolerance in RRAM Computing Systems". United States. doi:10.1109/jetcas.2017.2776980.
@article{osti_1541450,
title = {Stuck-at Fault Tolerance in RRAM Computing Systems},
author = {Xia, Lixue and Huangfu, Wenqin and Tang, Tianqi and Yin, Xiling and Chakrabarty, Krishnendu and Xie, Yuan and Wang, Yu and Yang, Huazhong},
abstractNote = {Not provided.},
doi = {10.1109/jetcas.2017.2776980},
journal = {IEEE Journal on Emerging and Selected Topics in Circuits and Systems},
issn = {2156-3357},
number = 1,
volume = 8,
place = {United States},
year = {2018},
month = {3}
}