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Title: X-Ray Sum Frequency Diffraction for Direct Imaging of Ultrafast Electron Dynamics

Abstract

Not provided.

Authors:
; ; ;
Publication Date:
Research Org.:
Univ. of California, Irvine, CA (United States)
Sponsoring Org.:
USDOE Office of Science (SC)
OSTI Identifier:
1541326
DOE Contract Number:  
FG02-04ER15571
Resource Type:
Journal Article
Journal Name:
Physical Review Letters
Additional Journal Information:
Journal Volume: 120; Journal Issue: 24; Journal ID: ISSN 0031-9007
Publisher:
American Physical Society (APS)
Country of Publication:
United States
Language:
English
Subject:
Physics

Citation Formats

Rouxel, Jérémy R., Kowalewski, Markus, Bennett, Kochise, and Mukamel, Shaul. X-Ray Sum Frequency Diffraction for Direct Imaging of Ultrafast Electron Dynamics. United States: N. p., 2018. Web. doi:10.1103/physrevlett.120.243902.
Rouxel, Jérémy R., Kowalewski, Markus, Bennett, Kochise, & Mukamel, Shaul. X-Ray Sum Frequency Diffraction for Direct Imaging of Ultrafast Electron Dynamics. United States. doi:10.1103/physrevlett.120.243902.
Rouxel, Jérémy R., Kowalewski, Markus, Bennett, Kochise, and Mukamel, Shaul. Fri . "X-Ray Sum Frequency Diffraction for Direct Imaging of Ultrafast Electron Dynamics". United States. doi:10.1103/physrevlett.120.243902.
@article{osti_1541326,
title = {X-Ray Sum Frequency Diffraction for Direct Imaging of Ultrafast Electron Dynamics},
author = {Rouxel, Jérémy R. and Kowalewski, Markus and Bennett, Kochise and Mukamel, Shaul},
abstractNote = {Not provided.},
doi = {10.1103/physrevlett.120.243902},
journal = {Physical Review Letters},
issn = {0031-9007},
number = 24,
volume = 120,
place = {United States},
year = {2018},
month = {6}
}

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