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Title: Theory and practice of electron diffraction from single atoms and extended objects using an EMPAD

Abstract

Not provided.

Authors:
 [1];  [1];  [1];  [2];  [3];  [1];  [4];  [4]
  1. School of Applied and Engineering Physics, Cornell University, Ithaca, NY 14853, USA
  2. Department of Physics, Cornell University, Ithaca, NY 14853, USA
  3. Department of Chemistry and Chemical Biology, Cornell University, Ithaca, NY 14853, USA
  4. School of Applied and Engineering Physics, Cornell University, Ithaca, NY 14853, USA; Kavli Institute for Nanoscale Science, Cornell University, Ithaca, NY 14853, USA
Publication Date:
Research Org.:
Cornell Univ., Ithaca, NY (United States)
Sponsoring Org.:
USDOE Office of Science (SC)
OSTI Identifier:
1540604
DOE Contract Number:  
SC0004079
Resource Type:
Journal Article
Journal Name:
Microscopy
Additional Journal Information:
Journal Volume: 67; Journal Issue: suppl_1; Journal ID: ISSN 2050-5698
Publisher:
Oxford University Press
Country of Publication:
United States
Language:
English
Subject:
Microscopy

Citation Formats

Cao, Michael C., Han, Yimo, Chen, Zhen, Jiang, Yi, Nguyen, Kayla X., Turgut, Emrah, Fuchs, Gregory D., and Muller, David A. Theory and practice of electron diffraction from single atoms and extended objects using an EMPAD. United States: N. p., 2017. Web. doi:10.1093/jmicro/dfx123.
Cao, Michael C., Han, Yimo, Chen, Zhen, Jiang, Yi, Nguyen, Kayla X., Turgut, Emrah, Fuchs, Gregory D., & Muller, David A. Theory and practice of electron diffraction from single atoms and extended objects using an EMPAD. United States. doi:10.1093/jmicro/dfx123.
Cao, Michael C., Han, Yimo, Chen, Zhen, Jiang, Yi, Nguyen, Kayla X., Turgut, Emrah, Fuchs, Gregory D., and Muller, David A. Fri . "Theory and practice of electron diffraction from single atoms and extended objects using an EMPAD". United States. doi:10.1093/jmicro/dfx123.
@article{osti_1540604,
title = {Theory and practice of electron diffraction from single atoms and extended objects using an EMPAD},
author = {Cao, Michael C. and Han, Yimo and Chen, Zhen and Jiang, Yi and Nguyen, Kayla X. and Turgut, Emrah and Fuchs, Gregory D. and Muller, David A.},
abstractNote = {Not provided.},
doi = {10.1093/jmicro/dfx123},
journal = {Microscopy},
issn = {2050-5698},
number = suppl_1,
volume = 67,
place = {United States},
year = {2017},
month = {12}
}