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Title: Energy-dependent etching-related impacts on CR-39 alpha detection efficiency for the Rn-222 and Rn-220 decay chains

Abstract

Not provided.

Authors:
; ;
Publication Date:
Research Org.:
Univ. of Michigan, Ann Arbor, MI (United States)
Sponsoring Org.:
USDOE National Nuclear Security Administration (NNSA)
OSTI Identifier:
1540558
DOE Contract Number:  
NA0002534
Resource Type:
Journal Article
Journal Name:
Journal of Instrumentation
Additional Journal Information:
Journal Volume: 13; Journal Issue: 04; Journal ID: ISSN 1748-0221
Publisher:
Institute of Physics (IOP)
Country of Publication:
United States
Language:
English
Subject:
Instruments & Instrumentation

Citation Formats

Tan, Y., Yuan, H., and Kearfott, K. J. Energy-dependent etching-related impacts on CR-39 alpha detection efficiency for the Rn-222 and Rn-220 decay chains. United States: N. p., 2018. Web. doi:10.1088/1748-0221/13/04/t04005.
Tan, Y., Yuan, H., & Kearfott, K. J. Energy-dependent etching-related impacts on CR-39 alpha detection efficiency for the Rn-222 and Rn-220 decay chains. United States. doi:10.1088/1748-0221/13/04/t04005.
Tan, Y., Yuan, H., and Kearfott, K. J. Sun . "Energy-dependent etching-related impacts on CR-39 alpha detection efficiency for the Rn-222 and Rn-220 decay chains". United States. doi:10.1088/1748-0221/13/04/t04005.
@article{osti_1540558,
title = {Energy-dependent etching-related impacts on CR-39 alpha detection efficiency for the Rn-222 and Rn-220 decay chains},
author = {Tan, Y. and Yuan, H. and Kearfott, K. J.},
abstractNote = {Not provided.},
doi = {10.1088/1748-0221/13/04/t04005},
journal = {Journal of Instrumentation},
issn = {1748-0221},
number = 04,
volume = 13,
place = {United States},
year = {2018},
month = {4}
}