skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Optimization of electrical treatment strategy for surface roughness reduction in conducting thin films

Abstract

Not provided.

Authors:
ORCiD logo [1]; ORCiD logo [1]
  1. Department of Chemical Engineering, University of Massachusetts, Amherst, Massachusetts 01003-9303, USA
Publication Date:
Research Org.:
Univ. of Massachusetts, Amherst, MA (United States)
Sponsoring Org.:
USDOE Office of Science (SC)
OSTI Identifier:
1540252
DOE Contract Number:  
FG02-07ER46407
Resource Type:
Journal Article
Journal Name:
Journal of Applied Physics
Additional Journal Information:
Journal Volume: 124; Journal Issue: 12; Journal ID: ISSN 0021-8979
Publisher:
American Institute of Physics (AIP)
Country of Publication:
United States
Language:
English
Subject:
Physics

Citation Formats

Du, Lin, and Maroudas, Dimitrios. Optimization of electrical treatment strategy for surface roughness reduction in conducting thin films. United States: N. p., 2018. Web. doi:10.1063/1.5047405.
Du, Lin, & Maroudas, Dimitrios. Optimization of electrical treatment strategy for surface roughness reduction in conducting thin films. United States. doi:10.1063/1.5047405.
Du, Lin, and Maroudas, Dimitrios. Fri . "Optimization of electrical treatment strategy for surface roughness reduction in conducting thin films". United States. doi:10.1063/1.5047405.
@article{osti_1540252,
title = {Optimization of electrical treatment strategy for surface roughness reduction in conducting thin films},
author = {Du, Lin and Maroudas, Dimitrios},
abstractNote = {Not provided.},
doi = {10.1063/1.5047405},
journal = {Journal of Applied Physics},
issn = {0021-8979},
number = 12,
volume = 124,
place = {United States},
year = {2018},
month = {9}
}