Electron ptychography of 2D materials to deep sub-ångström resolution
Abstract
Not provided.
- Authors:
- Publication Date:
- Research Org.:
- Cornell Univ., Ithaca, NY (United States)
- Sponsoring Org.:
- USDOE Office of Science (SC)
- OSTI Identifier:
- 1539851
- DOE Contract Number:
- SC0005827; SC0017631
- Resource Type:
- Journal Article
- Journal Name:
- Nature (London)
- Additional Journal Information:
- Journal Volume: 559; Journal Issue: 7714; Journal ID: ISSN 0028-0836
- Publisher:
- Nature Publishing Group
- Country of Publication:
- United States
- Language:
- English
- Subject:
- Science & Technology - Other Topics
Citation Formats
Jiang, Yi, Chen, Zhen, Han, Yimo, Deb, Pratiti, Gao, Hui, Xie, Saien, Purohit, Prafull, Tate, Mark W., Park, Jiwoong, Gruner, Sol M., Elser, Veit, and Muller, David A. Electron ptychography of 2D materials to deep sub-ångström resolution. United States: N. p., 2018.
Web. doi:10.1038/s41586-018-0298-5.
Jiang, Yi, Chen, Zhen, Han, Yimo, Deb, Pratiti, Gao, Hui, Xie, Saien, Purohit, Prafull, Tate, Mark W., Park, Jiwoong, Gruner, Sol M., Elser, Veit, & Muller, David A. Electron ptychography of 2D materials to deep sub-ångström resolution. United States. https://doi.org/10.1038/s41586-018-0298-5
Jiang, Yi, Chen, Zhen, Han, Yimo, Deb, Pratiti, Gao, Hui, Xie, Saien, Purohit, Prafull, Tate, Mark W., Park, Jiwoong, Gruner, Sol M., Elser, Veit, and Muller, David A. 2018.
"Electron ptychography of 2D materials to deep sub-ångström resolution". United States. https://doi.org/10.1038/s41586-018-0298-5.
@article{osti_1539851,
title = {Electron ptychography of 2D materials to deep sub-ångström resolution},
author = {Jiang, Yi and Chen, Zhen and Han, Yimo and Deb, Pratiti and Gao, Hui and Xie, Saien and Purohit, Prafull and Tate, Mark W. and Park, Jiwoong and Gruner, Sol M. and Elser, Veit and Muller, David A.},
abstractNote = {Not provided.},
doi = {10.1038/s41586-018-0298-5},
url = {https://www.osti.gov/biblio/1539851},
journal = {Nature (London)},
issn = {0028-0836},
number = 7714,
volume = 559,
place = {United States},
year = {Sun Jul 01 00:00:00 EDT 2018},
month = {Sun Jul 01 00:00:00 EDT 2018}
}
Other availability
Save to My Library
You must Sign In or Create an Account in order to save documents to your library.
Works referenced in this record:
Imaging and dynamics of light atoms and molecules on graphene
journal, July 2008
- Meyer, Jannik C.; Girit, C. O.; Crommie, M. F.
- Nature, Vol. 454, Issue 7202
Atom-by-atom structural and chemical analysis by annular dark-field electron microscopy
journal, March 2010
- Krivanek, Ondrej L.; Chisholm, Matthew F.; Nicolosi, Valeria
- Nature, Vol. 464, Issue 7288
Grains and grain boundaries in single-layer graphene atomic patchwork quilts
journal, January 2011
- Huang, Pinshane Y.; Ruiz-Vargas, Carlos S.; van der Zande, Arend M.
- Nature, Vol. 469, Issue 7330, p. 389-392
On Spectroscopic Resolving Power
journal, July 1916
- Sparrow, C. M.
- The Astrophysical Journal, Vol. 44
Electron microscopy image enhanced
journal, April 1998
- Haider, Maximilian; Uhlemann, Stephan; Schwan, Eugen
- Nature, Vol. 392, Issue 6678
Sub-ångstrom resolution using aberration corrected electron optics
journal, August 2002
- Batson, P. E.; Dellby, N.; Krivanek, O. L.
- Nature, Vol. 418, Issue 6898
Atomic-Resolution Imaging with a Sub-50-pm Electron Probe
journal, March 2009
- Erni, Rolf; Rossell, Marta D.; Kisielowski, Christian
- Physical Review Letters, Vol. 102, Issue 9
STEM imaging of 47-pm-separated atomic columns by a spherical aberration-corrected electron microscope with a 300-kV cold field emission gun
journal, June 2009
- Sawada, H.; Tanishiro, Y.; Ohashi, N.
- Journal of Electron Microscopy, Vol. 58, Issue 6
Transmission electron microscopy at 20kV for imaging and spectroscopy
journal, July 2011
- Kaiser, U.; Biskupek, J.; Meyer, J. C.
- Ultramicroscopy, Vol. 111, Issue 8
Accurate Measurement of Electron Beam Induced Displacement Cross Sections for Single-Layer Graphene
journal, May 2012
- Meyer, Jannik C.; Eder, Franz; Kurasch, Simon
- Physical Review Letters, Vol. 108, Issue 19
Atomic-Resolution STEM Imaging of Graphene at Low Voltage of 30 kV with Resolution Enhancement by Using Large Convergence Angle
journal, April 2015
- Sawada, H.; Sasaki, T.; Hosokawa, F.
- Physical Review Letters, Vol. 114, Issue 16
Chromatic Aberration Correction for Atomic Resolution TEM Imaging from 20 to 80 kV
journal, August 2016
- Linck, Martin; Hartel, Peter; Uhlemann, Stephan
- Physical Review Letters, Vol. 117, Issue 7
The potential and limitations of neutrons, electrons and X-rays for atomic resolution microscopy of unstained biological molecules
journal, May 1995
- Henderson, Richard
- Quarterly Reviews of Biophysics, Vol. 28, Issue 2
Beugung im inhomogenen Primärstrahlwellenfeld. I. Prinzip einer Phasenmessung von Elektronenbeungungsinterferenzen
journal, July 1969
- Hoppe, W.
- Acta Crystallographica Section A, Vol. 25, Issue 4
Resolution beyond the 'information limit' in transmission electron microscopy
journal, April 1995
- Nellist, P. D.; McCallum, B. C.; Rodenburg, J. M.
- Nature, Vol. 374, Issue 6523
Electron Ptychography. I. Experimental Demonstration Beyond the Conventional Resolution Limits
journal, January 1998
- Nellist, P. D.; Rodenburg, J. M.
- Acta Crystallographica Section A Foundations of Crystallography, Vol. 54, Issue 1
High-Resolution Scanning X-ray Diffraction Microscopy
journal, July 2008
- Thibault, P.; Dierolf, M.; Menzel, A.
- Science, Vol. 321, Issue 5887
An improved ptychographical phase retrieval algorithm for diffractive imaging
journal, September 2009
- Maiden, Andrew M.; Rodenburg, John M.
- Ultramicroscopy, Vol. 109, Issue 10
Reconstructing state mixtures from diffraction measurements
journal, February 2013
- Thibault, Pierre; Menzel, Andreas
- Nature, Vol. 494, Issue 7435
Ptychographic inversion via Wigner distribution deconvolution: Noise suppression and probe design
journal, December 2014
- Li, Peng; Edo, Tega B.; Rodenburg, John M.
- Ultramicroscopy, Vol. 147
Ptychographic transmission microscopy in three dimensions using a multi-slice approach
journal, January 2012
- Maiden, A. M.; Humphry, M. J.; Rodenburg, J. M.
- Journal of the Optical Society of America A, Vol. 29, Issue 8
Transmission microscopy without lenses for objects of unlimited size
journal, February 2007
- Rodenburg, J. M.; Hurst, A. C.; Cullis, A. G.
- Ultramicroscopy, Vol. 107, Issue 2-3
Hard-X-Ray Lensless Imaging of Extended Objects
journal, January 2007
- Rodenburg, J. M.; Hurst, A. C.; Cullis, A. G.
- Physical Review Letters, Vol. 98, Issue 3
Wave-front phase retrieval in transmission electron microscopy via ptychography
journal, September 2010
- Hüe, F.; Rodenburg, J. M.; Maiden, A. M.
- Physical Review B, Vol. 82, Issue 12
Extended ptychography in the transmission electron microscope: Possibilities and limitations
journal, July 2011
- Hüe, F.; Rodenburg, J. M.; Maiden, A. M.
- Ultramicroscopy, Vol. 111, Issue 8
Atom-Scale Ptychographic Electron Diffractive Imaging of Boron Nitride Cones
journal, February 2012
- Putkunz, Corey T.; D’Alfonso, Adrian J.; Morgan, Andrew J.
- Physical Review Letters, Vol. 108, Issue 7
Deterministic electron ptychography at atomic resolution
journal, February 2014
- D'Alfonso, A. J.; Morgan, A. J.; Yan, A. W. C.
- Physical Review B, Vol. 89, Issue 6
Efficient phase contrast imaging in STEM using a pixelated detector. Part 1: Experimental demonstration at atomic resolution
journal, April 2015
- Pennycook, Timothy J.; Lupini, Andrew R.; Yang, Hao
- Ultramicroscopy, Vol. 151, p. 160-167
Electron ptychographic phase imaging of light elements in crystalline materials using Wigner distribution deconvolution
journal, September 2017
- Yang, Hao; MacLaren, Ian; Jones, Lewys
- Ultramicroscopy, Vol. 180
Ptychographic electron microscopy using high-angle dark-field scattering for sub-nanometre resolution imaging
journal, January 2012
- Humphry, M. J.; Kraus, B.; Hurst, A. C.
- Nature Communications, Vol. 3, Issue 1
Count rate linearity and spectral response of the Medipix3RX chip coupled to a 300μm silicon sensor under high flux conditions
journal, April 2014
- Frojdh, E.; Ballabriga, R.; Campbell, M.
- Journal of Instrumentation, Vol. 9, Issue 04
High Dynamic Range Pixel Array Detector for Scanning Transmission Electron Microscopy
journal, January 2016
- Tate, Mark W.; Purohit, Prafull; Chamberlain, Darol
- Microscopy and Microanalysis, Vol. 22, Issue 1
Towards quantitative, atomic-resolution reconstruction of the electrostatic potential via differential phase contrast using electrons
journal, December 2015
- Close, R.; Chen, Z.; Shibata, N.
- Ultramicroscopy, Vol. 159
Phase contrast STEM for thin samples: Integrated differential phase contrast
journal, January 2016
- Lazić, Ivan; Bosch, Eric G. T.; Lazar, Sorin
- Ultramicroscopy, Vol. 160
Superresolution imaging via ptychography
journal, January 2011
- Maiden, Andrew M.; Humphry, Martin J.; Zhang, Fucai
- Journal of the Optical Society of America A, Vol. 28, Issue 4
The theory of super-resolution electron microscopy via Wigner-distribution deconvolution
journal, June 1992
- Rodenburg, J. M.; Bates, R. H. T.
- Philosophical Transactions of the Royal Society of London. Series A: Physical and Engineering Sciences, Vol. 339, Issue 1655, p. 521-553
Denoised Wigner distribution deconvolution via low-rank matrix completion
journal, January 2016
- Lee, Justin; Barbastathis, George
- Optics Express, Vol. 24, Issue 18
The Relation of Aperture and Power in the Microscope*
journal, June 1882
- Abbe,
- Journal of the Royal Microscopical Society, Vol. 2, Issue 3
Tailoring the Electronic Structure in Bilayer Molybdenum Disulfide via Interlayer Twist
journal, June 2014
- van der Zande, Arend M.; Kunstmann, Jens; Chernikov, Alexey
- Nano Letters, Vol. 14, Issue 7
Efficient elastic imaging of single atoms on ultrathin supports in a scanning transmission electron microscope
journal, December 2012
- Hovden, Robert; Muller, David A.
- Ultramicroscopy, Vol. 123
Adaptive step-size strategy for noise-robust Fourier ptychographic microscopy
journal, January 2016
- Zuo, Chao; Sun, Jiasong; Chen, Qian
- Optics Express, Vol. 24, Issue 18
Further improvements to the ptychographical iterative engine
journal, January 2017
- Maiden, Andrew; Johnson, Daniel; Li, Peng
- Optica, Vol. 4, Issue 7
High-Resolution Multislice X-Ray Ptychography of Extended Thick Objects
journal, February 2014
- Suzuki, Akihiro; Furutaku, Shin; Shimomura, Kei
- Physical Review Letters, Vol. 112, Issue 5
Periodic Artifact Reduction in Fourier Transforms of Full Field Atomic Resolution Images
journal, January 2015
- Hovden, Robert; Jiang, Yi; Xin, Huolin L.
- Microscopy and Microanalysis, Vol. 21, Issue 2
Modelling the inelastic scattering of fast electrons
journal, April 2015
- Allen, L. J.; D׳Alfonso, A. J.; Findlay, S. D.
- Ultramicroscopy, Vol. 151
Beyond the conventional information limit: the relevant coherence function
journal, May 1994
- Nellist, P. D.; Rodenburg, J. M.
- Ultramicroscopy, Vol. 54, Issue 1