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Title: Shell-Thickness-Dependent Biexciton Lifetime in Type I and Quasi-Type II CdSe@CdS Core/Shell Quantum Dots

Abstract

Not provided.

Authors:
 [1];  [2];  [3]; ORCiD logo [2];  [4]; ORCiD logo [5]
  1. College of Electronic Engineering, Heilongjiang University, Harbin 150080, China; State Key Laboratory of Molecular Reaction Dynamics, Dalian Institute of Chemical Physics, Chinese Academy of Sciences, 457 Zhongshan Road, Dalian 116023, China
  2. State Key Laboratory of Physical Chemistry of Solid Surfaces and Department of Chemistry, College of Chemistry and Chemical Engineering, Xiamen University, Xiamen 361005, China
  3. School of Environment and Civil Engineering, Jiangnan University, Wuxi 214122, China
  4. State Key Laboratory of Molecular Reaction Dynamics, Dalian Institute of Chemical Physics, Chinese Academy of Sciences, 457 Zhongshan Road, Dalian 116023, China
  5. Department of Chemistry, Emory University, 1515 Dickey Drive, NE, Atlanta, Georgia 30322, United States
Publication Date:
Research Org.:
Emory Univ., Atlanta, GA (United States)
Sponsoring Org.:
USDOE Office of Science (SC)
OSTI Identifier:
1539250
DOE Contract Number:  
SC0008798
Resource Type:
Journal Article
Journal Name:
Journal of Physical Chemistry. C
Additional Journal Information:
Journal Volume: 122; Journal Issue: 25; Journal ID: ISSN 1932-7447
Publisher:
American Chemical Society
Country of Publication:
United States
Language:
English
Subject:
Chemistry; Science & Technology - Other Topics; Materials Science

Citation Formats

Kong, Degui, Jia, Yanyan, Ren, Yueping, Xie, Zhaoxiong, Wu, Kaifeng, and Lian, Tianquan. Shell-Thickness-Dependent Biexciton Lifetime in Type I and Quasi-Type II CdSe@CdS Core/Shell Quantum Dots. United States: N. p., 2017. Web. doi:10.1021/acs.jpcc.8b01234.
Kong, Degui, Jia, Yanyan, Ren, Yueping, Xie, Zhaoxiong, Wu, Kaifeng, & Lian, Tianquan. Shell-Thickness-Dependent Biexciton Lifetime in Type I and Quasi-Type II CdSe@CdS Core/Shell Quantum Dots. United States. https://doi.org/10.1021/acs.jpcc.8b01234
Kong, Degui, Jia, Yanyan, Ren, Yueping, Xie, Zhaoxiong, Wu, Kaifeng, and Lian, Tianquan. 2017. "Shell-Thickness-Dependent Biexciton Lifetime in Type I and Quasi-Type II CdSe@CdS Core/Shell Quantum Dots". United States. https://doi.org/10.1021/acs.jpcc.8b01234.
@article{osti_1539250,
title = {Shell-Thickness-Dependent Biexciton Lifetime in Type I and Quasi-Type II CdSe@CdS Core/Shell Quantum Dots},
author = {Kong, Degui and Jia, Yanyan and Ren, Yueping and Xie, Zhaoxiong and Wu, Kaifeng and Lian, Tianquan},
abstractNote = {Not provided.},
doi = {10.1021/acs.jpcc.8b01234},
url = {https://www.osti.gov/biblio/1539250}, journal = {Journal of Physical Chemistry. C},
issn = {1932-7447},
number = 25,
volume = 122,
place = {United States},
year = {2017},
month = {12}
}