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Title: Transmission Electron Microscopy Studies of Electron-Selective Titanium Oxide Contacts in Silicon Solar Cells

Abstract

Abstract In this study, the cross-section of electron-selective titanium oxide (TiO 2) contacts forn-type crystalline silicon solar cells were investigated by transmission electron microscopy. It was revealed that the excellent cell efficiency of 21.6% obtained onn-type cells, featuring SiO 2/TiO 2/Al rear contacts and after forming gas annealing (FGA) at 350°C, is due to strong surface passivation of SiO 2/TiO 2stack as well as low contact resistivity at the Si/SiO 2/TiO 2heterojunction. This can be attributed to the transformation of amorphous TiO 2to a conducting TiO 2−xphase. Conversely, the low efficiency (9.8%) obtained on cells featuring an a-Si:H/TiO 2/Al rear contact is due to severe degradation of passivation of the a-Si:H upon FGA.

Authors:
; ; ; ;
Publication Date:
Research Org.:
State Univ. of New York (SUNY), Albany, NY (United States)
Sponsoring Org.:
USDOE Office of Energy Efficiency and Renewable Energy (EERE)
OSTI Identifier:
1538940
DOE Contract Number:  
EE0004947
Resource Type:
Journal Article
Journal Name:
Microscopy and Microanalysis
Additional Journal Information:
Journal Volume: 23; Journal Issue: 5; Journal ID: ISSN 1431-9276
Publisher:
Microscopy Society of America (MSA)
Country of Publication:
United States
Language:
English
Subject:
Materials Science; Microscopy

Citation Formats

Ali, Haider, Yang, Xinbo, Weber, Klaus, Schoenfeld, Winston V., and Davis, Kristopher O. Transmission Electron Microscopy Studies of Electron-Selective Titanium Oxide Contacts in Silicon Solar Cells. United States: N. p., 2017. Web. doi:10.1017/s1431927617012417.
Ali, Haider, Yang, Xinbo, Weber, Klaus, Schoenfeld, Winston V., & Davis, Kristopher O. Transmission Electron Microscopy Studies of Electron-Selective Titanium Oxide Contacts in Silicon Solar Cells. United States. doi:10.1017/s1431927617012417.
Ali, Haider, Yang, Xinbo, Weber, Klaus, Schoenfeld, Winston V., and Davis, Kristopher O. Tue . "Transmission Electron Microscopy Studies of Electron-Selective Titanium Oxide Contacts in Silicon Solar Cells". United States. doi:10.1017/s1431927617012417.
@article{osti_1538940,
title = {Transmission Electron Microscopy Studies of Electron-Selective Titanium Oxide Contacts in Silicon Solar Cells},
author = {Ali, Haider and Yang, Xinbo and Weber, Klaus and Schoenfeld, Winston V. and Davis, Kristopher O.},
abstractNote = {Abstract In this study, the cross-section of electron-selective titanium oxide (TiO2) contacts forn-type crystalline silicon solar cells were investigated by transmission electron microscopy. It was revealed that the excellent cell efficiency of 21.6% obtained onn-type cells, featuring SiO2/TiO2/Al rear contacts and after forming gas annealing (FGA) at 350°C, is due to strong surface passivation of SiO2/TiO2stack as well as low contact resistivity at the Si/SiO2/TiO2heterojunction. This can be attributed to the transformation of amorphous TiO2to a conducting TiO2−xphase. Conversely, the low efficiency (9.8%) obtained on cells featuring an a-Si:H/TiO2/Al rear contact is due to severe degradation of passivation of the a-Si:H upon FGA.},
doi = {10.1017/s1431927617012417},
journal = {Microscopy and Microanalysis},
issn = {1431-9276},
number = 5,
volume = 23,
place = {United States},
year = {2017},
month = {8}
}