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Title: Sampling limits for electron tomography with sparsity-exploiting reconstructions

Abstract

Not provided.

Authors:
; ; ;
Publication Date:
Research Org.:
Cornell Univ., Ithaca, NY (United States); Kitware, Inc., Clifton Park, NY (United States)
Sponsoring Org.:
USDOE Office of Science (SC)
OSTI Identifier:
1538889
DOE Contract Number:  
SC0005827; SC0011385
Resource Type:
Journal Article
Journal Name:
Ultramicroscopy
Additional Journal Information:
Journal Volume: 186; Journal Issue: C; Journal ID: ISSN 0304-3991
Publisher:
Elsevier
Country of Publication:
United States
Language:
English
Subject:
Microscopy

Citation Formats

Jiang, Yi, Padgett, Elliot, Hovden, Robert, and Muller, David A. Sampling limits for electron tomography with sparsity-exploiting reconstructions. United States: N. p., 2018. Web. doi:10.1016/j.ultramic.2017.12.010.
Jiang, Yi, Padgett, Elliot, Hovden, Robert, & Muller, David A. Sampling limits for electron tomography with sparsity-exploiting reconstructions. United States. doi:10.1016/j.ultramic.2017.12.010.
Jiang, Yi, Padgett, Elliot, Hovden, Robert, and Muller, David A. Thu . "Sampling limits for electron tomography with sparsity-exploiting reconstructions". United States. doi:10.1016/j.ultramic.2017.12.010.
@article{osti_1538889,
title = {Sampling limits for electron tomography with sparsity-exploiting reconstructions},
author = {Jiang, Yi and Padgett, Elliot and Hovden, Robert and Muller, David A.},
abstractNote = {Not provided.},
doi = {10.1016/j.ultramic.2017.12.010},
journal = {Ultramicroscopy},
issn = {0304-3991},
number = C,
volume = 186,
place = {United States},
year = {2018},
month = {3}
}