Sampling limits for electron tomography with sparsity-exploiting reconstructions
Abstract
Not provided.
- Authors:
- Publication Date:
- Research Org.:
- Cornell Univ., Ithaca, NY (United States); Kitware, Inc., Clifton Park, NY (United States)
- Sponsoring Org.:
- USDOE Office of Science (SC)
- OSTI Identifier:
- 1538889
- DOE Contract Number:
- SC0005827; SC0011385
- Resource Type:
- Journal Article
- Journal Name:
- Ultramicroscopy
- Additional Journal Information:
- Journal Volume: 186; Journal Issue: C; Journal ID: ISSN 0304-3991
- Publisher:
- Elsevier
- Country of Publication:
- United States
- Language:
- English
- Subject:
- Microscopy
Citation Formats
Jiang, Yi, Padgett, Elliot, Hovden, Robert, and Muller, David A. Sampling limits for electron tomography with sparsity-exploiting reconstructions. United States: N. p., 2018.
Web. doi:10.1016/j.ultramic.2017.12.010.
Jiang, Yi, Padgett, Elliot, Hovden, Robert, & Muller, David A. Sampling limits for electron tomography with sparsity-exploiting reconstructions. United States. https://doi.org/10.1016/j.ultramic.2017.12.010
Jiang, Yi, Padgett, Elliot, Hovden, Robert, and Muller, David A. 2018.
"Sampling limits for electron tomography with sparsity-exploiting reconstructions". United States. https://doi.org/10.1016/j.ultramic.2017.12.010.
@article{osti_1538889,
title = {Sampling limits for electron tomography with sparsity-exploiting reconstructions},
author = {Jiang, Yi and Padgett, Elliot and Hovden, Robert and Muller, David A.},
abstractNote = {Not provided.},
doi = {10.1016/j.ultramic.2017.12.010},
url = {https://www.osti.gov/biblio/1538889},
journal = {Ultramicroscopy},
issn = {0304-3991},
number = C,
volume = 186,
place = {United States},
year = {Thu Mar 01 00:00:00 EST 2018},
month = {Thu Mar 01 00:00:00 EST 2018}
}
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