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Title: On determining dead layer and detector thicknesses for a position-sensitive silicon detector

Abstract

Not provided.

Authors:
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Publication Date:
Research Org.:
Univ. of Massachusetts, Amherst, MA (United States)
Sponsoring Org.:
USDOE Office of Science (SC)
OSTI Identifier:
1538656
DOE Contract Number:  
FG02-94ER40848
Resource Type:
Journal Article
Journal Name:
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
Additional Journal Information:
Journal Volume: 888; Journal Issue: C; Journal ID: ISSN 0168-9002
Publisher:
Elsevier
Country of Publication:
United States
Language:
English
Subject:
Instruments & Instrumentation; Nuclear Science & Technology; Physics

Citation Formats

Manfredi, J., Lee, Jenny, Lynch, W. G., Niu, C. Y., Tsang, M. B., Anderson, C., Barney, J., Brown, K. W., Chajecki, Z., Chan, K. P., Chen, G., Estee, J., Li, Z., Pruitt, C., Rogers, A. M., Sanetullaev, A., Setiawan, H., Showalter, R., Tsang, C. Y., Winkelbauer, J. R., Xiao, Z., and Xu, Z. On determining dead layer and detector thicknesses for a position-sensitive silicon detector. United States: N. p., 2018. Web. doi:10.1016/j.nima.2017.12.082.
Manfredi, J., Lee, Jenny, Lynch, W. G., Niu, C. Y., Tsang, M. B., Anderson, C., Barney, J., Brown, K. W., Chajecki, Z., Chan, K. P., Chen, G., Estee, J., Li, Z., Pruitt, C., Rogers, A. M., Sanetullaev, A., Setiawan, H., Showalter, R., Tsang, C. Y., Winkelbauer, J. R., Xiao, Z., & Xu, Z. On determining dead layer and detector thicknesses for a position-sensitive silicon detector. United States. doi:10.1016/j.nima.2017.12.082.
Manfredi, J., Lee, Jenny, Lynch, W. G., Niu, C. Y., Tsang, M. B., Anderson, C., Barney, J., Brown, K. W., Chajecki, Z., Chan, K. P., Chen, G., Estee, J., Li, Z., Pruitt, C., Rogers, A. M., Sanetullaev, A., Setiawan, H., Showalter, R., Tsang, C. Y., Winkelbauer, J. R., Xiao, Z., and Xu, Z. Sun . "On determining dead layer and detector thicknesses for a position-sensitive silicon detector". United States. doi:10.1016/j.nima.2017.12.082.
@article{osti_1538656,
title = {On determining dead layer and detector thicknesses for a position-sensitive silicon detector},
author = {Manfredi, J. and Lee, Jenny and Lynch, W. G. and Niu, C. Y. and Tsang, M. B. and Anderson, C. and Barney, J. and Brown, K. W. and Chajecki, Z. and Chan, K. P. and Chen, G. and Estee, J. and Li, Z. and Pruitt, C. and Rogers, A. M. and Sanetullaev, A. and Setiawan, H. and Showalter, R. and Tsang, C. Y. and Winkelbauer, J. R. and Xiao, Z. and Xu, Z.},
abstractNote = {Not provided.},
doi = {10.1016/j.nima.2017.12.082},
journal = {Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment},
issn = {0168-9002},
number = C,
volume = 888,
place = {United States},
year = {2018},
month = {4}
}