Spectroscopic ellipsometry for analysis of polycrystalline thin-film photovoltaic devices and prediction of external quantum efficiency
Journal Article
·
· Applied Surface Science
Not provided.
- Research Organization:
- Stanford Univ., CA (United States); Old Dominion Univ., Norfolk, VA (United States); Univ. of Illinois at Urbana-Champaign, IL (United States)
- Sponsoring Organization:
- USDOE Office of Energy Efficiency and Renewable Energy (EERE)
- DOE Contract Number:
- EE0004946; EE0005400; EE0005405
- OSTI ID:
- 1538010
- Journal Information:
- Applied Surface Science, Vol. 421, Issue PB; ISSN 0169-4332
- Publisher:
- Elsevier
- Country of Publication:
- United States
- Language:
- English
Similar Records
Spectroscopic ellipsometry for analysis of polycrystalline thin-film photovoltaic devices and prediction of external quantum efficiency
Optical simulation of external quantum efficiency spectra of CuIn1-xGaxSe2 solar cells from spectroscopic ellipsometry inputs
Optical simulation of external quantum efficiency spectra of CuIn1−Ga Se2 solar cells from spectroscopic ellipsometry inputs
Journal Article
·
Wed Jan 04 00:00:00 EST 2017
· Applied Surface Science
·
OSTI ID:1538010
+5 more
Optical simulation of external quantum efficiency spectra of CuIn1-xGaxSe2 solar cells from spectroscopic ellipsometry inputs
Journal Article
·
Sun Jul 01 00:00:00 EDT 2018
· Journal of Energy Chemistry
·
OSTI ID:1538010
+5 more
Optical simulation of external quantum efficiency spectra of CuIn1−Ga Se2 solar cells from spectroscopic ellipsometry inputs
Journal Article
·
Sun Jul 01 00:00:00 EDT 2018
· Journal of Energy Chemistry
·
OSTI ID:1538010
+5 more