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Title: Radiation damage reduction by grain-boundary biased defect migration in nanocrystalline Cu

Abstract

Not provided.

Authors:
; ORCiD logo; ; ORCiD logo
Publication Date:
Research Org.:
Texas A & M Univ., College Station, TX (United States). Texas A & M Engineering Experiment Station
Sponsoring Org.:
USDOE Office of Nuclear Energy (NE)
OSTI Identifier:
1537913
DOE Contract Number:  
NE0008450
Resource Type:
Journal Article
Journal Name:
Acta Materialia
Additional Journal Information:
Journal Volume: 155; Journal Issue: C; Journal ID: ISSN 1359-6454
Publisher:
Elsevier
Country of Publication:
United States
Language:
English
Subject:
Materials Science; Metallurgy & Metallurgical Engineering

Citation Formats

Jin, Miaomiao, Cao, Penghui, Yip, Sidney, and Short, Michael P. Radiation damage reduction by grain-boundary biased defect migration in nanocrystalline Cu. United States: N. p., 2018. Web. doi:10.1016/j.actamat.2018.05.071.
Jin, Miaomiao, Cao, Penghui, Yip, Sidney, & Short, Michael P. Radiation damage reduction by grain-boundary biased defect migration in nanocrystalline Cu. United States. doi:10.1016/j.actamat.2018.05.071.
Jin, Miaomiao, Cao, Penghui, Yip, Sidney, and Short, Michael P. Wed . "Radiation damage reduction by grain-boundary biased defect migration in nanocrystalline Cu". United States. doi:10.1016/j.actamat.2018.05.071.
@article{osti_1537913,
title = {Radiation damage reduction by grain-boundary biased defect migration in nanocrystalline Cu},
author = {Jin, Miaomiao and Cao, Penghui and Yip, Sidney and Short, Michael P.},
abstractNote = {Not provided.},
doi = {10.1016/j.actamat.2018.05.071},
journal = {Acta Materialia},
issn = {1359-6454},
number = C,
volume = 155,
place = {United States},
year = {2018},
month = {8}
}