Visualizing Stress and Temperature Distribution During Elevated Temperature Deformation of IN-617 Using Nanomechanical Raman Spectroscopy

Zhang, Yang; Wang, Hao; Tomar, Vikas

doi:10.1007/s11837-017-2710-2

Title: Visualizing Stress and Temperature Distribution During Elevated Temperature Deformation of IN-617 Using Nanomechanical Raman Spectroscopy

Journal Article · Thu Dec 21 00:00:00 EST 2017 · JOM. Journal of the Minerals, Metals & Materials Society

DOI:https://doi.org/10.1007/s11837-017-2710-2· OSTI ID:1537841

Zhang, Yang; Wang, Hao; Tomar, Vikas

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Research Organization:: Purdue Univ., West Lafayette, IN (United States)

Sponsoring Organization:: USDOE Office of Nuclear Energy (NE)

DOE Contract Number:: NE0008558

OSTI ID:: 1537841

Journal Information:: JOM. Journal of the Minerals, Metals & Materials Society, Vol. 70, Issue 4; ISSN 1047-4838

Publisher:: Springer

Country of Publication:: United States

Language:: English

References (15)

Threshold Stress Creep Behavior of Alloy 617 at Intermediate Temperatures Benz, Julian K.; Carroll, Laura J.; Wright, Jill K. Metallurgical and Materials Transactions A, Vol. 45, Issue 7 https://doi.org/10.1007/s11661-014-2244-y	journal	March 2014
A new x-ray diffractometer design for thin-film texture, strain, and phase characterization Flinn, P. A. Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, Vol. 6, Issue 6 https://doi.org/10.1116/1.584172	journal	November 1988
Effect of static uniaxial stress on the Raman spectrum of silicon Anastassakis, E.; Pinczuk, A.; Burstein, E. Solid State Communications, Vol. 8, Issue 2 https://doi.org/10.1016/0038-1098(70)90588-0	journal	January 1970
Evaluation of Incoherent Interface Strength of Solid-State-Bonded Ti64/Stainless Steel Under Dynamic Impact Loading Verma, Devendra; Singh, Jogender; Varma, Amit H. JOM, Vol. 67, Issue 8 https://doi.org/10.1007/s11837-015-1448-y	journal	May 2015
Raman Thermometry Based Thermal Conductivity Measurement of Bovine Cortical Bone as a Function of Compressive Stress Zhang, Yang; Gan, Ming; Tomar, Vikas Journal of Nanotechnology in Engineering and Medicine, Vol. 5, Issue 2 https://doi.org/10.1115/1.4027989	journal	May 2014
An investigation into strain rate dependent constitutive properties of a sandwiched epoxy interface Verma, Devendra; Exner, Matthias; Tomar, Vikas Materials & Design, Vol. 112 https://doi.org/10.1016/j.matdes.2016.09.068	journal	December 2016
A nanomechanical Raman spectroscopy based assessment of stress distribution in irradiated and corroded SiC Mohanty, Debapriya Pinaki; Wang, Hao; Okuniewski, Maria Journal of Nuclear Materials, Vol. 497 https://doi.org/10.1016/j.jnucmat.2017.07.025	journal	December 2017
Raman Spectroscopy-Based Investigation of Thermal Conductivity of Stressed Silicon Microcantilevers Gan, Ming; Samvedi, Vikas; Tomar, Vikas Journal of Thermophysics and Heat Transfer, Vol. 29, Issue 4 https://doi.org/10.2514/1.T4491	journal	October 2015
An in situ platform for the investigation of Raman shift in micro-scale silicon structures as a function of mechanical stress and temperature increase Gan, Ming; Tomar, Vikas Review of Scientific Instruments, Vol. 85, Issue 1 https://doi.org/10.1063/1.4861201	journal	January 2014
Temperature Dependence of the Width of the Fundamental Lattice-Vibration Absorption Peak in Ionic Crystals. II. Approximate Numerical Results Ipatova, I. P.; Maradudin, A. A.; Wallis, R. F. Physical Review, Vol. 155, Issue 3 https://doi.org/10.1103/PhysRev.155.882	journal	March 1967
Anharmonic effects in light scattering due to optical phonons in silicon Balkanski, M.; Wallis, R. F.; Haro, E. Physical Review B, Vol. 28, Issue 4 https://doi.org/10.1103/PhysRevB.28.1928	journal	August 1983
Visualizing stress in silicon micro cantilevers using scanning confocal Raman spectroscopy Bauer, M.; Gigler, A. M.; Richter, C. Microelectronic Engineering, Vol. 85, Issue 5-6 https://doi.org/10.1016/j.mee.2008.01.089	journal	May 2008
Studying grain boundary regions in polycrystalline materials using spherical nano-indentation and orientation imaging microscopy Pathak, Siddhartha; Michler, Johann; Wasmer, Kilian Journal of Materials Science, Vol. 47, Issue 2 https://doi.org/10.1007/s10853-011-5859-z	journal	August 2011
Orientation imaging microscopy: Emerging and future applications Adams, Brent L. Ultramicroscopy, Vol. 67, Issue 1-4 https://doi.org/10.1016/S0304-3991(96)00103-9	journal	June 1997
Orientation imaging: The emergence of a new microscopy Adams, Brent L.; Wright, Stuart I.; Kunze, Karsten Metallurgical Transactions A, Vol. 24, Issue 4 https://doi.org/10.1007/BF02656503	journal	April 1993

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