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Visualizing Stress and Temperature Distribution During Elevated Temperature Deformation of IN-617 Using Nanomechanical Raman Spectroscopy

Journal Article · · JOM. Journal of the Minerals, Metals & Materials Society
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Not provided.

Research Organization:
Purdue Univ., West Lafayette, IN (United States)
Sponsoring Organization:
USDOE Office of Nuclear Energy (NE)
DOE Contract Number:
NE0008558
OSTI ID:
1537841
Journal Information:
JOM. Journal of the Minerals, Metals & Materials Society, Vol. 70, Issue 4; ISSN 1047-4838
Publisher:
Springer
Country of Publication:
United States
Language:
English

References (15)

Threshold Stress Creep Behavior of Alloy 617 at Intermediate Temperatures March 2014
A new x-ray diffractometer design for thin-film texture, strain, and phase characterization November 1988
Effect of static uniaxial stress on the Raman spectrum of silicon January 1970
Evaluation of Incoherent Interface Strength of Solid-State-Bonded Ti64/Stainless Steel Under Dynamic Impact Loading May 2015
Raman Thermometry Based Thermal Conductivity Measurement of Bovine Cortical Bone as a Function of Compressive Stress May 2014
An investigation into strain rate dependent constitutive properties of a sandwiched epoxy interface December 2016
A nanomechanical Raman spectroscopy based assessment of stress distribution in irradiated and corroded SiC December 2017
Raman Spectroscopy-Based Investigation of Thermal Conductivity of Stressed Silicon Microcantilevers October 2015
An in situ platform for the investigation of Raman shift in micro-scale silicon structures as a function of mechanical stress and temperature increase January 2014
Temperature Dependence of the Width of the Fundamental Lattice-Vibration Absorption Peak in Ionic Crystals. II. Approximate Numerical Results March 1967
Anharmonic effects in light scattering due to optical phonons in silicon August 1983
Visualizing stress in silicon micro cantilevers using scanning confocal Raman spectroscopy May 2008
Studying grain boundary regions in polycrystalline materials using spherical nano-indentation and orientation imaging microscopy August 2011
Orientation imaging microscopy: Emerging and future applications June 1997
Orientation imaging: The emergence of a new microscopy April 1993

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