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Title: Intercorrelated In-Plane and Out-of-Plane Ferroelectricity in Ultrathin Two-Dimensional Layered Semiconductor In 2 Se 3

Abstract

Not provided.

Authors:
 [1]; ORCiD logo [2]; ORCiD logo [3];  [4];  [3];  [5];  [6];  [3];  [5];  [1]; ORCiD logo [1]; ORCiD logo [1]; ORCiD logo [1]; ORCiD logo [6];  [7]; ORCiD logo [8]
  1. Physical Sciences and Engineering Division, King Abdullah University of Science and Technology, Thuwal, Jeddah 23955-6900, Kingdom of Saudi Arabia
  2. Physical Sciences and Engineering Division, King Abdullah University of Science and Technology, Thuwal, Jeddah 23955-6900, Kingdom of Saudi Arabia; Shenyang National Laboratory for Materials Science, Institute of Metal Research (IMR), Chinese Academy of Sciences (CAS), Shenyang 110016, China
  3. Department of Chemical Engineering and Materials Science, University of California - Irvine, Irvine, California 92697, America
  4. Department of Physics and Astronomy, University of California - Irvine, Irvine, California 92697, America
  5. Key Laboratory of Flexible Electronics and Institute of Advanced Materials, Jiangsu National Synergetic Innovation Center for Advanced Materials, Nanjing Tech University, Nanjing, Jiangsu 211816, China
  6. ICQD, Hefei National Laboratory for Physical Sciences at the Microscale, Synergetic Innovation Center of Quantum Information and Quantum Physics, and Key Laboratory of Strongly-Coupled Quantum Matter Physics (CAS), University of Science and Technology of China, Hefei, Anhui 230026, China
  7. Department of Chemical Engineering and Materials Science, University of California - Irvine, Irvine, California 92697, America; Department of Physics and Astronomy, University of California - Irvine, Irvine, California 92697, America
  8. Physical Sciences and Engineering Division, King Abdullah University of Science and Technology, Thuwal, Jeddah 23955-6900, Kingdom of Saudi Arabia; Corporate Research and Chief Technology Office, Taiwan Semiconductor Manufacturing Company, Hsinchu 30075, Taiwan
Publication Date:
Research Org.:
Univ. of California, Irvine, CA (United States)
Sponsoring Org.:
USDOE Office of Science (SC)
OSTI Identifier:
1537263
DOE Contract Number:  
SC0014430
Resource Type:
Journal Article
Journal Name:
Nano Letters
Additional Journal Information:
Journal Volume: 18; Journal Issue: 2; Journal ID: ISSN 1530-6984
Publisher:
American Chemical Society
Country of Publication:
United States
Language:
English
Subject:
Chemistry; Science & Technology - Other Topics; Materials Science; Physics

Citation Formats

Cui, Chaojie, Hu, Wei-Jin, Yan, Xingxu, Addiego, Christopher, Gao, Wenpei, Wang, Yao, Wang, Zhe, Li, Linze, Cheng, Yingchun, Li, Peng, Zhang, Xixiang, Alshareef, Husam N., Wu, Tom, Zhu, Wenguang, Pan, Xiaoqing, and Li, Lain-Jong. Intercorrelated In-Plane and Out-of-Plane Ferroelectricity in Ultrathin Two-Dimensional Layered Semiconductor In 2 Se 3. United States: N. p., 2018. Web. doi:10.1021/acs.nanolett.7b04852.
Cui, Chaojie, Hu, Wei-Jin, Yan, Xingxu, Addiego, Christopher, Gao, Wenpei, Wang, Yao, Wang, Zhe, Li, Linze, Cheng, Yingchun, Li, Peng, Zhang, Xixiang, Alshareef, Husam N., Wu, Tom, Zhu, Wenguang, Pan, Xiaoqing, & Li, Lain-Jong. Intercorrelated In-Plane and Out-of-Plane Ferroelectricity in Ultrathin Two-Dimensional Layered Semiconductor In 2 Se 3. United States. doi:10.1021/acs.nanolett.7b04852.
Cui, Chaojie, Hu, Wei-Jin, Yan, Xingxu, Addiego, Christopher, Gao, Wenpei, Wang, Yao, Wang, Zhe, Li, Linze, Cheng, Yingchun, Li, Peng, Zhang, Xixiang, Alshareef, Husam N., Wu, Tom, Zhu, Wenguang, Pan, Xiaoqing, and Li, Lain-Jong. Mon . "Intercorrelated In-Plane and Out-of-Plane Ferroelectricity in Ultrathin Two-Dimensional Layered Semiconductor In 2 Se 3". United States. doi:10.1021/acs.nanolett.7b04852.
@article{osti_1537263,
title = {Intercorrelated In-Plane and Out-of-Plane Ferroelectricity in Ultrathin Two-Dimensional Layered Semiconductor In 2 Se 3},
author = {Cui, Chaojie and Hu, Wei-Jin and Yan, Xingxu and Addiego, Christopher and Gao, Wenpei and Wang, Yao and Wang, Zhe and Li, Linze and Cheng, Yingchun and Li, Peng and Zhang, Xixiang and Alshareef, Husam N. and Wu, Tom and Zhu, Wenguang and Pan, Xiaoqing and Li, Lain-Jong},
abstractNote = {Not provided.},
doi = {10.1021/acs.nanolett.7b04852},
journal = {Nano Letters},
issn = {1530-6984},
number = 2,
volume = 18,
place = {United States},
year = {2018},
month = {1}
}