Reducing orbital occupancy in VO 2 suppresses Mott physics while Peierls distortions persist
- Binghamton University, NY (United States); National Institute of Standards and Technology (NIST), Gaithersburg, MD (United States)
- Cornell University, Ithaca, NY (United States)
- Cornell University, Ithaca, NY (United States); Cornell University, Ithaca, NY (United States). Kavli Institute for Nanoscale Science
- Binghamton University, NY (United States)
- University of Illinois at Urbana-Champaign, IL (United States)
- University of Bremen (Germany)
- University of South Florida, Tampa, FL (United States)
- National Institute of Standards and Technology (NIST), Gaithersburg, MD (United States)
The characteristics of the cooperative Mott-Peierls metal-insulator transition (MIT) of VO2 can be altered by employing epitaxial strain. While the most commonly used substrate for this purpose is isostructural rutile TiO2, thin films often suffer from interdiffusion of Ti ions near the interface. Exploiting this phenomena, we investigate the nature of interfacial V4+/Ti4+ cation intermixing and its effects on the MIT using scanning transmission electron microscopy with electron energy loss spectroscopy (STEM-EELS), soft x-ray absorption spectroscopy (XAS), and hard x-ray photoelectron spectroscopy (HAXPES), along with supporting density functional theory (DFT) calculations. We find that the reduced orbital occupancy in highly Ti incorporated VO2 is responsible for suppressing the MIT. Interdiffused films are found to be metallic at all measured temperatures, despite a resolute dimerization inferred from x-ray absorption data at lower temperatures. Here our results demonstrate that the Mott physics can be suppressed in doped VO2, while a lattice dimerization remains thermodynamically favorable.
- Research Organization:
- Cornell Univ., Ithaca, NY (United States)
- Sponsoring Organization:
- USDOE Office of Science (SC), Basic Energy Sciences (BES). Materials Sciences & Engineering Division (MSE); National Science Foundation (NSF); USDOE
- Grant/Contract Number:
- SC0002334; AC02-05CH11231; AC02-98CH10886; DMR 1409912; DMR-1120296
- OSTI ID:
- 1535986
- Alternate ID(s):
- OSTI ID: 1374451
- Journal Information:
- Physical Review. B, Vol. 96, Issue 8; ISSN 2469-9950
- Publisher:
- American Physical Society (APS)Copyright Statement
- Country of Publication:
- United States
- Language:
- English
Web of Science
Similar Records
Growth and characterization of large
Electronic structure and topology across