Simulating contrast inversion in atomic force microscopy imaging with real-space pseudopotentials
Journal Article
·
· Physical Review. B
- Univ. of Texas, Austin, TX (United States)
Atomic force microscopy (AFM) measurements have reported contrast inversions for systems such as Cu2N and graphene that can hamper image interpretation and characterization. In this work, we apply a simulation method based on ab initio real-space pseudopotentials to gain an understanding of the tip-sample interactions that influence the inversion. We find that chemically reactive tips induce an attractive binding force that results in the contrast inversion. We find that the inversion is tip height dependent and not observed when using less reactive CO-functionalized tips.
- Research Organization:
- Univ. of Texas, Austin, TX (United States)
- Sponsoring Organization:
- USDOE Office of Science (SC), Advanced Scientific Computing Research (ASCR)
- Grant/Contract Number:
- FG02-06ER46286; SC0008877
- OSTI ID:
- 1535858
- Alternate ID(s):
- OSTI ID: 1342445
- Journal Information:
- Physical Review. B, Vol. 95, Issue 8; ISSN 2469-9950
- Publisher:
- American Physical Society (APS)Copyright Statement
- Country of Publication:
- United States
- Language:
- English
Cited by: 9 works
Citation information provided by
Web of Science
Web of Science
Simulating noncontact atomic force microscopy images
|
journal | November 2019 |
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