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Title: Simulating contrast inversion in atomic force microscopy imaging with real-space pseudopotentials

Journal Article · · Physical Review. B

Atomic force microscopy (AFM) measurements have reported contrast inversions for systems such as Cu2N and graphene that can hamper image interpretation and characterization. In this work, we apply a simulation method based on ab initio real-space pseudopotentials to gain an understanding of the tip-sample interactions that influence the inversion. We find that chemically reactive tips induce an attractive binding force that results in the contrast inversion. We find that the inversion is tip height dependent and not observed when using less reactive CO-functionalized tips.

Research Organization:
Univ. of Texas, Austin, TX (United States)
Sponsoring Organization:
USDOE Office of Science (SC), Advanced Scientific Computing Research (ASCR)
Grant/Contract Number:
FG02-06ER46286; SC0008877
OSTI ID:
1535858
Alternate ID(s):
OSTI ID: 1342445
Journal Information:
Physical Review. B, Vol. 95, Issue 8; ISSN 2469-9950
Publisher:
American Physical Society (APS)Copyright Statement
Country of Publication:
United States
Language:
English
Citation Metrics:
Cited by: 9 works
Citation information provided by
Web of Science

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Cited By (1)

Simulating noncontact atomic force microscopy images journal November 2019