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Title: Role of grain size on redox induced compositional stresses in Pr doped ceria thin films

Abstract

In-situwafer curvature and x-ray diffraction measurements were employed to investigate the grain size dependence of stress and strain in Pr doped ceria thin films.

Authors:
ORCiD logo [1];  [2]; ORCiD logo [3];  [4];  [3];  [1]
  1. School of Engineering; Brown University; Providence; USA
  2. Materials Processing Center and Department of Materials Science and Engineering; Massachusetts Institute of Technology; Cambridge; USA
  3. Materials Processing Center and Department of Materials Science and Engineering; Massachusetts Institute of Technology; Cambridge; USA; International Institute for Carbon Neutral Energy Research (WPI-I2CNER)
  4. Kazuo Inamori School of Engineering; Alfred University; Alfred; USA
Publication Date:
Research Org.:
Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States)
Sponsoring Org.:
USDOE Office of Science (SC)
OSTI Identifier:
1535187
DOE Contract Number:  
SC0002633
Resource Type:
Journal Article
Journal Name:
Physical Chemistry Chemical Physics. PCCP (Print)
Additional Journal Information:
Journal Volume: 19; Journal Issue: 19; Journal ID: ISSN 1463-9076
Publisher:
Royal Society of Chemistry
Country of Publication:
United States
Language:
English
Subject:
Chemistry; Physics

Citation Formats

Sheth, Jay, Chen, Di, Tuller, Harry L., Misture, Scott T., Bishop, Sean R., and Sheldon, Brian W. Role of grain size on redox induced compositional stresses in Pr doped ceria thin films. United States: N. p., 2017. Web. doi:10.1039/c7cp00088j.
Sheth, Jay, Chen, Di, Tuller, Harry L., Misture, Scott T., Bishop, Sean R., & Sheldon, Brian W. Role of grain size on redox induced compositional stresses in Pr doped ceria thin films. United States. doi:10.1039/c7cp00088j.
Sheth, Jay, Chen, Di, Tuller, Harry L., Misture, Scott T., Bishop, Sean R., and Sheldon, Brian W. Sun . "Role of grain size on redox induced compositional stresses in Pr doped ceria thin films". United States. doi:10.1039/c7cp00088j.
@article{osti_1535187,
title = {Role of grain size on redox induced compositional stresses in Pr doped ceria thin films},
author = {Sheth, Jay and Chen, Di and Tuller, Harry L. and Misture, Scott T. and Bishop, Sean R. and Sheldon, Brian W.},
abstractNote = {In-situwafer curvature and x-ray diffraction measurements were employed to investigate the grain size dependence of stress and strain in Pr doped ceria thin films.},
doi = {10.1039/c7cp00088j},
journal = {Physical Chemistry Chemical Physics. PCCP (Print)},
issn = {1463-9076},
number = 19,
volume = 19,
place = {United States},
year = {2017},
month = {1}
}

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