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Title: Influence of Noise-Generating Factors on Cross-Correlation Electron Backscatter Diffraction (EBSD) Measurement of Geometrically Necessary Dislocations (GNDs)

Abstract

Abstract Studies of dislocation density evolution are fundamental to improved understanding in various areas of deformation mechanics. Recent advances in cross-correlation techniques, applied to electron backscatter diffraction (EBSD) data have particularly shed light on geometrically necessary dislocation (GND) behavior. However, the framework is relatively computationally expensive—patterns are typically saved from the EBSD scan and analyzed offline. A better understanding of the impact of EBSD pattern degradation, such as binning, compression, and various forms of noise, is vital to enable optimization of rapid and low-cost GND analysis. This paper tackles the problem by setting up a set of simulated patterns that mimic real patterns corresponding to a known GND field. The patterns are subsequently degraded in terms of resolution and noise, and the GND densities calculated from the degraded patterns using cross-correlation ESBD are compared with the known values. Some confirmation of validity of the computational degradation of patterns by considering real pattern degradation is also undertaken. The results demonstrate that the EBSD technique is not particularly sensitive to lower levels of binning and image compression, but the precision is sensitive to Poisson-type noise. Some insight is also gained concerning effects of mixed patterns at a grain boundary on measured GNDmore » content.« less

Authors:
; ; ; ; ; ;
Publication Date:
Research Org.:
Brigham Young Univ., Provo, UT (United States)
Sponsoring Org.:
USDOE Office of Science (SC)
OSTI Identifier:
1534404
DOE Contract Number:  
SC0012587
Resource Type:
Journal Article
Journal Name:
Microscopy and Microanalysis
Additional Journal Information:
Journal Volume: 23; Journal Issue: 3; Journal ID: ISSN 1431-9276
Publisher:
Microscopy Society of America (MSA)
Country of Publication:
United States
Language:
English
Subject:
Materials Science; Microscopy

Citation Formats

Hansen, Landon T., Jackson, Brian E., Fullwood, David T., Wright, Stuart I., De Graef, Marc, Homer, Eric R., and Wagoner, Robert H. Influence of Noise-Generating Factors on Cross-Correlation Electron Backscatter Diffraction (EBSD) Measurement of Geometrically Necessary Dislocations (GNDs). United States: N. p., 2017. Web. doi:10.1017/s1431927617000204.
Hansen, Landon T., Jackson, Brian E., Fullwood, David T., Wright, Stuart I., De Graef, Marc, Homer, Eric R., & Wagoner, Robert H. Influence of Noise-Generating Factors on Cross-Correlation Electron Backscatter Diffraction (EBSD) Measurement of Geometrically Necessary Dislocations (GNDs). United States. doi:10.1017/s1431927617000204.
Hansen, Landon T., Jackson, Brian E., Fullwood, David T., Wright, Stuart I., De Graef, Marc, Homer, Eric R., and Wagoner, Robert H. Mon . "Influence of Noise-Generating Factors on Cross-Correlation Electron Backscatter Diffraction (EBSD) Measurement of Geometrically Necessary Dislocations (GNDs)". United States. doi:10.1017/s1431927617000204.
@article{osti_1534404,
title = {Influence of Noise-Generating Factors on Cross-Correlation Electron Backscatter Diffraction (EBSD) Measurement of Geometrically Necessary Dislocations (GNDs)},
author = {Hansen, Landon T. and Jackson, Brian E. and Fullwood, David T. and Wright, Stuart I. and De Graef, Marc and Homer, Eric R. and Wagoner, Robert H.},
abstractNote = {Abstract Studies of dislocation density evolution are fundamental to improved understanding in various areas of deformation mechanics. Recent advances in cross-correlation techniques, applied to electron backscatter diffraction (EBSD) data have particularly shed light on geometrically necessary dislocation (GND) behavior. However, the framework is relatively computationally expensive—patterns are typically saved from the EBSD scan and analyzed offline. A better understanding of the impact of EBSD pattern degradation, such as binning, compression, and various forms of noise, is vital to enable optimization of rapid and low-cost GND analysis. This paper tackles the problem by setting up a set of simulated patterns that mimic real patterns corresponding to a known GND field. The patterns are subsequently degraded in terms of resolution and noise, and the GND densities calculated from the degraded patterns using cross-correlation ESBD are compared with the known values. Some confirmation of validity of the computational degradation of patterns by considering real pattern degradation is also undertaken. The results demonstrate that the EBSD technique is not particularly sensitive to lower levels of binning and image compression, but the precision is sensitive to Poisson-type noise. Some insight is also gained concerning effects of mixed patterns at a grain boundary on measured GND content.},
doi = {10.1017/s1431927617000204},
journal = {Microscopy and Microanalysis},
issn = {1431-9276},
number = 3,
volume = 23,
place = {United States},
year = {2017},
month = {3}
}