Error-correction coding for hot-swapping semiconductor devices
Patent
·
OSTI ID:1531955
A memory read operation is directed at a group of semiconductor devices from which a first semiconductor device has been removed. An error in data for the memory read operation is detected based on error-correction coding (ECC). The error is caused at least in part by the first semiconductor device having been removed. ECC is used to determine corrected data for the memory read operation.
- Research Organization:
- Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)
- Sponsoring Organization:
- USDOE
- DOE Contract Number:
- AC52-07NA27344
- Assignee:
- Advanced Micro Devices, Inc. (Sunnyvale, CA)
- Patent Number(s):
- 9,484,113
- Application Number:
- 14/253,638
- OSTI ID:
- 1531955
- Country of Publication:
- United States
- Language:
- English
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