skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Transistor having increased breakdown voltage

Patent ·
OSTI ID:1531916

A transistor includes a source finger electrode having a source finger electrode beginning and a source finger electrode end. The transistor also includes a drain finger electrode with a curved drain finger electrode end having an increased radius of curvature. The resulting decreased electric field at the curved drain finger electrode end allows for an increased breakdown voltage and a more robust and reliable transistor.

Research Organization:
International Rectifier Corp., El Segundo, CA (United States)
Sponsoring Organization:
USDOE
DOE Contract Number:
AR0000016
Assignee:
Infineon Technologies Americas Corp. (El Segundo, CA)
Patent Number(s):
9,379,231
Application Number:
13/749,477
OSTI ID:
1531916
Resource Relation:
Patent File Date: 2013-01-24
Country of Publication:
United States
Language:
English

References (13)

Multi-gate semiconductor devices patent-application January 2012
Semiconductor Apparatus patent-application June 2011
Semiconductor Device and Fabrication Method of the Semiconductor Device patent-application October 2009
Semiconductor Device and Fabrication Method Thereof patent-application November 2012
Structure and Layout of a FET Prime Cell patent-application April 2006
LDMOS transistor with enhanced termination region for high breakdown voltage with low on-resistance patent-application September 2004
Semiconductor Device patent-application April 2009
Semiconductor device and manufacturing method thereof patent-application December 2002
Semiconductor Device and Manufacturing Method for the Same patent-application October 2010
Field Effect Transistor patent-application January 2009
Semiconductor Device patent-application February 2012
LDMOS Having a Field Plate patent-application May 2011
Semiconductor Structure patent-application August 2010

Related Subjects