A1MgB14 and related icosahedral boride semiconducting materials for neutron sensing applications

Cook, Bruce A.; Snyder, John Evan; Constant, Alan P.; Tian, Yun

A1MgB14 and related icosahedral boride semiconducting materials for neutron sensing applications

Patent · 20 May 2008

OSTI ID:1531558

Cook, Bruce A.; Snyder, John Evan; Constant, Alan P.; Tian, Yun

A neutron detecting and method of use for a semiconducting material having a formula of M1M2B14 where M1 is aluminum, magnesium, silver, sodium or scandium and M2 is boron, chromium, erbium, holmium, lithium, magnesium, thulium, titanium, yttrium, or gadolinium.

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Research Organization:: Iowa State Univ., Ames, IA (United States)

Sponsoring Organization:: USDOE

DOE Contract Number:: W-7405-ENG-82

Assignee:: Iowa State University Research Foundation, Inc. (Ames, IA)

Patent Number(s):: 7,375,343

Application Number:: 11/422,629

OSTI ID:: 1531558

Country of Publication:: United States

Language:: English

References (15)

A new class of ultra-hard materials based on AlMgB14 Cook, B. A.; Harringa, J. L.; Lewis, T. L. Scripta Materialia, Vol. 42, Issue 6 https://doi.org/10.1016/S1359-6462(99)00400-5	journal	February 2000
Microstructure evolution of Al–Mg–B thin films by thermal annealing Tian, Y.; Constant, A.; Lo, C. C. H. Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, Vol. 21, Issue 4 https://doi.org/10.1116/1.1586274	journal	July 2003
Electrical transport in amorphous semiconducting AlMgB14 films Tian, Y.; Li, G.; Shinar, J. Applied Physics Letters, Vol. 85, Issue 7 https://doi.org/10.1063/1.1781738	journal	August 2004
Coefficient of thermal expansion of AlMgB14 Russell, A. M.; Cook, B. A.; Harringa, J. L. Scripta Materialia, Vol. 46, Issue 9 https://doi.org/10.1016/S1359-6462(02)00034-9	journal	May 2002
Effect of bias on neutron detection in thin semiconducting boron carbide films Day, E.; Diaz, M. J.; Adenwalla, S. Journal of Physics D: Applied Physics, Vol. 39, Issue 14 https://doi.org/10.1088/0022-3727/39/14/007	journal	June 2006
Boron carbide/ n -silicon carbide heterojunction diodes Adenwalla, S.; Welsch, P.; Harken, A. Applied Physics Letters, Vol. 79, Issue 26 https://doi.org/10.1063/1.1426257	journal	December 2001
A class of boron-rich solid-state neutron detectors Robertson, B. W.; Adenwalla, S.; Harken, A. Applied Physics Letters, Vol. 80, Issue 19 https://doi.org/10.1063/1.1477942	journal	May 2002
Design considerations for thin film coated semiconductor thermal neutron detectors—I: basics regarding alpha particle emitting neutron reactive films McGregor, D. S.; Hammig, M. D.; Yang, Y.-H. Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 500, Issue 1-3, p. 272-308 https://doi.org/10.1016/S0168-9002(02)02078-8	journal	March 2003
Boron Phosphide on Silicon for Radiation Detectors Lund, J. C.; Olschner, F.; Ahmed, F. MRS Proceedings, Vol. 162 https://doi.org/10.1557/PROC-162-601	journal	January 1989
Al2MgO4, Fe3O4, and FeB impurities in AlMgB14 Lewis, T. L.; Cook, B. A.; Harringa, J. L. Materials Science and Engineering: A, Vol. 351, Issue 1-2 https://doi.org/10.1016/S0921-5093(02)00835-3	journal	June 2003
Characterization of boron carbide thin films fabricated by plasma enhanced chemical vapor deposition from boranes Lee, Sunwoo; Mazurowski, John; Ramseyer, G. Journal of Applied Physics, Vol. 72, Issue 10 https://doi.org/10.1063/1.352060	journal	November 1992
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Semi-insulating bulk GaAs thermal neutron imaging arrays McGregor, D. S.; Lindsay, J. T.; Brannon, C. C. IEEE Transactions on Nuclear Science, Vol. 43, Issue 3 https://doi.org/10.1109/23.507065	journal	June 1996
Thermal neutron irradiation experiments on 10BP single-crystal wafers Kumashiro, Y.; Kudo, K.; Matsumoto, K. Journal of the Less Common Metals, Vol. 143, Issue 1-2 https://doi.org/10.1016/0022-5088(88)90031-8	journal	October 1988
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