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Enhanced neutron detector and electron amplifier structure and a method of fabricating the enhanced neutron detector and electron amplifier structure

Patent ·
OSTI ID:1531402
An enhanced electron amplifier structure includes a substrate configured to amplify a signal of an incident particle by causing a cascade of secondary electron emissions and an enhancement layer configured to increase a sensitivity of the substrate to the incident particle. The enhancement layer is provided on an upper surface of the substrate.
Research Organization:
Argonne National Laboratory (ANL), Argonne, IL (United States)
Sponsoring Organization:
USDOE
DOE Contract Number:
AC02-06CH11357
Assignee:
UChicago Argonne, LLC (Chicago, IL)
Patent Number(s):
10,180,508
Application Number:
15/691,652
OSTI ID:
1531402
Country of Publication:
United States
Language:
English

References (4)

Effects of ion barrier film on image noise in generation III image tube conference August 2012
Electron transmittance characteristics of MCP ion barrier film conference January 2005
A neutron detector based on microchannel plates report May 1987
The Research on Preparation Process Optimization of Ion Barrier Film on the Input Side of MCP journal May 2013