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Title: Exploration of High Miller-Index Crystals as High-Energy X-Ray Imaging Optics LO-02-15, Year 1 of 1

Abstract

Presentation describes use of high Miller indices (h,k,l) to increase the number of options for near-normal-incidence crystal imaging at high x-ray energies, in keeping with SDRD project to quantify the reflectivity of a particular high Miller-index crystal, compare with calculations, and evaluate for high-E crystal imaging applications.

Authors:
 [1];  [1];  [1]
  1. National Security Technologies, LLC. (NSTec), Mercury, NV (United States)
Publication Date:
Research Org.:
Nevada National Security Site/National Security Technologies, LLC (United States)
Sponsoring Org.:
USDOE National Nuclear Security Administration (NNSA), Office of Defense Programs (DP) (NA-10)
OSTI Identifier:
1526637
Report Number(s):
DOE/NV/25946-2584
DOE Contract Number:  
DE-AC52-06NA25946
Resource Type:
Conference
Resource Relation:
Conference: For the final quarter presentation of FY 2015 SDRD Final Review held in Las Vegas, NV, on September 17, 2015, at the Great Basin (Left and Right), Nevada Support Facility, Las Vegas, Nevada.
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION; Crystal, reflectivity, x-ray imaging

Citation Formats

Koch, Jeffrey, Haugh, Mike, and Lee, Josh. Exploration of High Miller-Index Crystals as High-Energy X-Ray Imaging Optics LO-02-15, Year 1 of 1. United States: N. p., 2015. Web.
Koch, Jeffrey, Haugh, Mike, & Lee, Josh. Exploration of High Miller-Index Crystals as High-Energy X-Ray Imaging Optics LO-02-15, Year 1 of 1. United States.
Koch, Jeffrey, Haugh, Mike, and Lee, Josh. Thu . "Exploration of High Miller-Index Crystals as High-Energy X-Ray Imaging Optics LO-02-15, Year 1 of 1". United States. https://www.osti.gov/servlets/purl/1526637.
@article{osti_1526637,
title = {Exploration of High Miller-Index Crystals as High-Energy X-Ray Imaging Optics LO-02-15, Year 1 of 1},
author = {Koch, Jeffrey and Haugh, Mike and Lee, Josh},
abstractNote = {Presentation describes use of high Miller indices (h,k,l) to increase the number of options for near-normal-incidence crystal imaging at high x-ray energies, in keeping with SDRD project to quantify the reflectivity of a particular high Miller-index crystal, compare with calculations, and evaluate for high-E crystal imaging applications.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2015},
month = {9}
}

Conference:
Other availability
Please see Document Availability for additional information on obtaining the full-text document. Library patrons may search WorldCat to identify libraries that hold this conference proceeding.

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