Toward High-Intensity Ionization Chamber Beam Intensity Monitors in Switchyard

doi:10.2172/1524806

Title: Toward High-Intensity Ionization Chamber Beam Intensity Monitors in Switchyard

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Abstract

aBeam intensity in the Switchyard beamlines is monitored by Secondary Emission Monitors ("SEMs") and Ionization Chambers ("ICs"). While less-expensive and easier to calibrate than SEMs, IC performance has typically degraded at higher beam intensities. This paper describes a proof-of-principle modification to a standard IC and associated electronics to increase the upper dynamic range of the system, showing that it is feasible to use ICs for high-intensity beamlines.

Authors:

Watts, Adam ^[1]

Fermilab

Publication Date:: 2018-01-01

Research Org.:: Fermi National Accelerator Lab. (FNAL), Batavia, IL (United States)

Sponsoring Org.:: USDOE Office of Science (SC), High Energy Physics (HEP) (SC-25)

OSTI Identifier:: 1524806

Report Number(s):: FERMILAB-TM-2698-AD
1738626

DOE Contract Number:: AC02-07CH11359

Resource Type:: Technical Report

Country of Publication:: United States

Language:: English

Subject:: 43 PARTICLE ACCELERATORS

Citation Formats


                    Watts, Adam. Toward High-Intensity Ionization Chamber Beam Intensity Monitors in Switchyard.  United States: N. p., 2018. 
        Web.  doi:10.2172/1524806.

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                    Watts, Adam. Toward High-Intensity Ionization Chamber Beam Intensity Monitors in Switchyard.  United States.  doi:10.2172/1524806.

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                    Watts, Adam. Mon .  
        "Toward High-Intensity Ionization Chamber Beam Intensity Monitors in Switchyard".  United States.  doi:10.2172/1524806.  https://www.osti.gov/servlets/purl/1524806.

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@article{osti_1524806,

  title        = {Toward High-Intensity Ionization Chamber Beam Intensity Monitors in Switchyard},

  author       = {Watts, Adam},

  abstractNote = {aBeam intensity in the Switchyard beamlines is monitored by Secondary Emission Monitors ("SEMs") and Ionization Chambers ("ICs"). While less-expensive and easier to calibrate than SEMs, IC performance has typically degraded at higher beam intensities. This paper describes a proof-of-principle modification to a standard IC and associated electronics to increase the upper dynamic range of the system, showing that it is feasible to use ICs for high-intensity beamlines.},

  doi          = {10.2172/1524806},

  journal      = {},
number       = ,

  volume       = ,

  place        = {United States},

  year         = {2018},

  month        = {1}

}

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DOI: 10.2172/1524806

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