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Title: Toward High-Intensity Ionization Chamber Beam Intensity Monitors in Switchyard

Abstract

aBeam intensity in the Switchyard beamlines is monitored by Secondary Emission Monitors ("SEMs") and Ionization Chambers ("ICs"). While less-expensive and easier to calibrate than SEMs, IC performance has typically degraded at higher beam intensities. This paper describes a proof-of-principle modification to a standard IC and associated electronics to increase the upper dynamic range of the system, showing that it is feasible to use ICs for high-intensity beamlines.

Authors:
 [1]
  1. Fermilab
Publication Date:
Research Org.:
Fermi National Accelerator Lab. (FNAL), Batavia, IL (United States)
Sponsoring Org.:
USDOE Office of Science (SC), High Energy Physics (HEP) (SC-25)
OSTI Identifier:
1524806
Report Number(s):
FERMILAB-TM-2698-AD
1738626
DOE Contract Number:  
AC02-07CH11359
Resource Type:
Technical Report
Country of Publication:
United States
Language:
English
Subject:
43 PARTICLE ACCELERATORS

Citation Formats

Watts, Adam. Toward High-Intensity Ionization Chamber Beam Intensity Monitors in Switchyard. United States: N. p., 2018. Web. doi:10.2172/1524806.
Watts, Adam. Toward High-Intensity Ionization Chamber Beam Intensity Monitors in Switchyard. United States. doi:10.2172/1524806.
Watts, Adam. Mon . "Toward High-Intensity Ionization Chamber Beam Intensity Monitors in Switchyard". United States. doi:10.2172/1524806. https://www.osti.gov/servlets/purl/1524806.
@article{osti_1524806,
title = {Toward High-Intensity Ionization Chamber Beam Intensity Monitors in Switchyard},
author = {Watts, Adam},
abstractNote = {aBeam intensity in the Switchyard beamlines is monitored by Secondary Emission Monitors ("SEMs") and Ionization Chambers ("ICs"). While less-expensive and easier to calibrate than SEMs, IC performance has typically degraded at higher beam intensities. This paper describes a proof-of-principle modification to a standard IC and associated electronics to increase the upper dynamic range of the system, showing that it is feasible to use ICs for high-intensity beamlines.},
doi = {10.2172/1524806},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2018},
month = {1}
}

Technical Report:

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