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Title: Single-Event Characterization of the 16 nm FinFET Xilinx Kintex UltraScale+ in Heavy Ions.

Abstract

Abstract not provided.

Authors:
; ; ; ; ;
Publication Date:
Research Org.:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Org.:
USDOE National Nuclear Security Administration (NNSA)
OSTI Identifier:
1523344
Report Number(s):
SAND2018-5487C
663380
DOE Contract Number:  
AC04-94AL85000
Resource Type:
Conference
Resource Relation:
Conference: Proposed for presentation at the Single Event Effects Symposium and Military and Aerospace Programmable Logic Devices Workshop held May 21-24, 2018 in La Jolla, CA.
Country of Publication:
United States
Language:
English

Citation Formats

Lee, David S., King, Michael Patrick, Evans, William L., Cannon, Matthew, Wirthlin, Michael, and Rice, William Charles. Single-Event Characterization of the 16 nm FinFET Xilinx Kintex UltraScale+ in Heavy Ions.. United States: N. p., 2018. Web.
Lee, David S., King, Michael Patrick, Evans, William L., Cannon, Matthew, Wirthlin, Michael, & Rice, William Charles. Single-Event Characterization of the 16 nm FinFET Xilinx Kintex UltraScale+ in Heavy Ions.. United States.
Lee, David S., King, Michael Patrick, Evans, William L., Cannon, Matthew, Wirthlin, Michael, and Rice, William Charles. Tue . "Single-Event Characterization of the 16 nm FinFET Xilinx Kintex UltraScale+ in Heavy Ions.". United States. https://www.osti.gov/servlets/purl/1523344.
@article{osti_1523344,
title = {Single-Event Characterization of the 16 nm FinFET Xilinx Kintex UltraScale+ in Heavy Ions.},
author = {Lee, David S. and King, Michael Patrick and Evans, William L. and Cannon, Matthew and Wirthlin, Michael and Rice, William Charles},
abstractNote = {Abstract not provided.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2018},
month = {5}
}

Conference:
Other availability
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