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Title: Sparse sampling in Scanning Electron Microscopes.

Abstract

Abstract not provided.

Authors:
Publication Date:
Research Org.:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Org.:
USDOE National Nuclear Security Administration (NNSA)
OSTI Identifier:
1515808
Report Number(s):
SAND2018-5237C
663310
DOE Contract Number:  
AC04-94AL85000
Resource Type:
Conference
Resource Relation:
Conference: Proposed for presentation at the Society for Industrial and Applied Mathematics, Imaging Science 2018 (SIAM IS-18) held June 5-8, 2018 in Bologna, Italy.
Country of Publication:
United States
Language:
English

Citation Formats

Larson, Kurt W. Sparse sampling in Scanning Electron Microscopes.. United States: N. p., 2018. Web.
Larson, Kurt W. Sparse sampling in Scanning Electron Microscopes.. United States.
Larson, Kurt W. Tue . "Sparse sampling in Scanning Electron Microscopes.". United States. https://www.osti.gov/servlets/purl/1515808.
@article{osti_1515808,
title = {Sparse sampling in Scanning Electron Microscopes.},
author = {Larson, Kurt W.},
abstractNote = {Abstract not provided.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2018},
month = {5}
}

Conference:
Other availability
Please see Document Availability for additional information on obtaining the full-text document. Library patrons may search WorldCat to identify libraries that hold this conference proceeding.

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