Quantification of Charge Transfer at the Interfaces of Oxide Thin Films

Meng, Qingping; Xu, Guangyong; Xin, Huolin; Stach, Eric A.; Zhu, Yimei; Su, Dong

doi:10.1021/acs.jpca.9b02802

Title: Quantification of Charge Transfer at the Interfaces of Oxide Thin Films

Journal Article · Fri May 03 00:00:00 EDT 2019 · Journal of Physical Chemistry. A, Molecules, Spectroscopy, Kinetics, Environment, and General Theory

DOI:https://doi.org/10.1021/acs.jpca.9b02802· OSTI ID:1513058

Meng, Qingping; Xu, Guangyong; Xin, Huolin;

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The interfacial electronic distribution in transition metal oxide thin films is crucial to their interfacial physical or chemical behaviors. Core-loss electron energy-loss spectroscopy (EELS) may potentially give valuable information of local electronic density of state at high spatial resolution. Here, we studied the electronic properties at the interface of Pb(Zr_0.2Ti_0.8)O₃ (PZT)/4.8-nm La_0.8Sr_0.2MnO₃ (LSMO)/SrTiO₃ (STO) using valance-EELS with a scanning transmission electron microscope (STEM). Modeled with dielectric function theory, the charge transfer in the vicinity of the interfaces of PZT/LSMO and LSMO/STO were determined from the shifts of plasma peaks of VEELS, agreeing with theoretical prediction. Our work demonstrates that VEELS method enables a high-efficient quantification of the charge transfer at interfaces, shedding the light on the charge transfer issues at heterogenous interfaces in physical and chemical devices.

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Research Organization:: Brookhaven National Laboratory (BNL), Upton, NY (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES)

Grant/Contract Number:: SC0012704

OSTI ID:: 1513058

Alternate ID(s):: OSTI ID: 1513225

Report Number(s):: BNL-211623-2019-JAAM

Journal Information:: Journal of Physical Chemistry. A, Molecules, Spectroscopy, Kinetics, Environment, and General Theory, Journal Name: Journal of Physical Chemistry. A, Molecules, Spectroscopy, Kinetics, Environment, and General Theory Vol. 123 Journal Issue: 21; ISSN 1089-5639

Publisher:: American Chemical SocietyCopyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 5 works

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Title: Quantification of Charge Transfer at the Interfaces of Oxide Thin Films

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