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Title: Converse magnetoelectric effects in composites of liquid phase epitaxy grown nickel zinc ferrite films and lead zirconate titanate: Studies on the influence of ferrite film parameters

Journal Article · · Physical Review Materials
 [1];  [2];  [1];  [3];  [4];  [5];  [5];  [6];  [6];  [6];  [7];  [8];  [9];  [6]
  1. Oakland Univ., Rochester, MI (United States); Hubei Univ., Wuhan (China)
  2. Oakland Univ., Rochester, MI (United States); Taras Shevchenko National University of Kyiv (Ukraine)
  3. Oakland Univ., Rochester, MI (United States)
  4. Novgorod State Univ., Veliky Novgorod (Russia)
  5. Hubei Univ., Wuhan (China)
  6. Air Force Research Lab. (AFRL), Wright-Patterson AFB, OH (United States)
  7. Argonne National Lab. (ANL), Lemont, IL (United States)
  8. Virginia Polytechnic Inst. and State Univ. (Virginia Tech), Blacksburg, VA (United States)
  9. Oakland Univ., Rochester, MI (United States); Air Force Research Lab. (AFRL), Wright-Patterson AFB, OH (United States)

The interactions among electric and magnetic subsystems in a ferroelectric-ferromagnetic composite occur through mechanical forces. In this work, we discuss results of a systematic investigation on the strength of the magnetic response of the composite to an applied electric field, known as the converse magnetoelectric (CME) effect, and its dependence on the ferroic order parameters and volume fraction for the two phases. Studies were carried out on composites of lead zirconate titanate and 2-30-μm m-thick nickel zinc ferrite (NZFO) films grown by liquid phase epitaxy on lattice matched (100) and (111) MgO substrates. Ferromagnetic resonance was utilized to determine the strength of CME from data on electric field E induced shift in the resonance frequency and its dependence on ferrite film orientation and thickness as well as MgO substrate thickness. The CME coupling coefficient A was found to be a factor of 2 to 4 higher in samples with NZFO films with (100) orientation than for (111) films. A decrease in A was measured with increasing ferrite film thickness and a very significant enhancement in the strength of CME was measured for decreasing MgO thickness. A model for CME that takes into consideration the influence of nonferroic MgO substrate was developed, and estimated A values are in very good agreement with the data. The findings presented here are also of importance for a new class of electric field tunable ferrite microwave devices.

Research Organization:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Organization:
National Science Foundation (NSF); National Natural Science Foundation of China (NSFC); Air Force Research Laboratory (AFRL); US Air Force Office of Scientific Research (AFOSR)
Grant/Contract Number:
AC02-06CH11357
OSTI ID:
1512437
Journal Information:
Physical Review Materials, Vol. 3, Issue 4; ISSN 2475-9953
Publisher:
American Physical Society (APS)Copyright Statement
Country of Publication:
United States
Language:
English
Citation Metrics:
Cited by: 6 works
Citation information provided by
Web of Science

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