Application of wavelet analysis on transient reflectivity in ultra-thin films

Sarraf, S. Yousefi; Trappen, R.; Kumari, S.; Bhandari, G.; Mottaghi, N.; Huang, C. Y.; Cabrera, G. B.; Bristow, A. D.; Holcomb, M. B.

doi:10.1364/OE.27.014684

Title: Application of wavelet analysis on transient reflectivity in ultra-thin films

Journal Article · Mon May 06 00:00:00 EDT 2019 · Optics Express

DOI:https://doi.org/10.1364/OE.27.014684· OSTI ID:1511084

; Trappen, R.; Kumari, S.; Bhandari, G.; Mottaghi, N.; Huang, C. Y.; Cabrera, G. B.; Bristow, A. D.; Holcomb, M. B.

Applications of wavelet analysis in ultra-thin film transient reflectivity (TR) measurements have been investigated. Advantages of utilizing different localized wavelet bases, in position and time, have been addressed on the residual TR signals. Morse wavelets have been used to obtain information from the abrupt oscillatory modes in the signal, which are not distinguishable with conventional methods such as Fourier transforms. These abrupt oscillatory modes are caused by the surface, interface, or any short-lived oscillatory modes which are suppressed in the TR signal in ultra-thin films. It is demonstrated that by choosing different Morse wavelets, information regarding different oscillatory modes in the TR signal of a heterostructure thin film is achievable. Moreover, by performing wavelet analysis on multiferroic heterostructures, oscillators modes with very close energy ranges are easily distinguishable. For illustration, residuals of the TR signals have been obtained by a pump-probe set up in reflectivity mode on La_0.7Sr_0.3MnO₃/SrTiO₃ and BaTiO₃/La_0.7Sr_0.3MnO₃/SrTiO₃ samples where sufficient signal to noise ratios have been achieved by taking multiple scans. The residual signals have been analyzed with Morse wavelets, and multiple oscillatory modes with close energy ranges have been observed and distinguished. This approach can isolate the location of various oscillatory modes at the surface interface and in the bulk of the heterostructure sample

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Research Organization:: West Virginia Univ., Morgantown, WV (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES); National Science Foundation (NSF)

Grant/Contract Number:: SC0016176; DMR-1608656

OSTI ID:: 1511084

Alternate ID(s):: OSTI ID: 1594028

Journal Information:: Optics Express, Journal Name: Optics Express Vol. 27 Journal Issue: 10; ISSN 1094-4087

Publisher:: Optical Society of America (OSA)Copyright Statement

Country of Publication:: United States

Language:: English

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