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Title: Correlation between epitaxial strain and magnetic properties in La 0.7 Sr 0.3 CoO 3 /La 0.7 Sr 0.3 MnO 3 bilayers

Journal Article · · Journal of Applied Physics
DOI:https://doi.org/10.1063/1.5054003· OSTI ID:1507390
 [1];  [1]; ORCiD logo [1];  [2];  [2]; ORCiD logo [1];  [3]
  1. Department of Materials Science and Engineering, University of California, Davis, Davis, California 95616, USA
  2. Department of Chemistry, University of Oregon, Eugene, Oregon 97403, USA
  3. Physical and Computational Science Directorate, Pacific Northwest National Laboratory, Richland, Washington 99354, USA

Magnetic properties arising at interfaces of perovskite oxides such as La0.7Sr0.3CoO3 (LSCO) and La0.7Sr0.3MnO3 (LSMO) depend sensitively on the fine details of their structural properties. In this work, we use high-resolution transmission electron microscopy and spectroscopy to examine the structural and electronic phenomena at the interfaces in two LSCO/LSMO bilayers with reversed growth order. Two different strain mechanisms are at work in these films: compressive or tensile epitaxial strain, and distortion of the octahedral tilt pattern to maintain a network of corner-sharing octahedra. While the epitaxial strain is constant regardless of the growth order, the modification of the octahedral tilt pattern depends on whether the film is grown directly on the substrate or as the second sublayer. As a consequence, exchange spring behavior is observed only when the LSCO sublayer is grown first. The different mechanisms of strain accommodation within the oxygen octahedra network in each material proved to be of critical importance in determining the interfacial structure and thus magnetic and electronic properties of the bilayers.

Research Organization:
Pacific Northwest National Laboratory (PNNL), Richland, WA (United States)
Sponsoring Organization:
USDOE
DOE Contract Number:
AC05-76RL01830
OSTI ID:
1507390
Report Number(s):
PNNL-SA-142751
Journal Information:
Journal of Applied Physics, Vol. 125, Issue 8; ISSN 0021-8979
Publisher:
American Institute of Physics (AIP)
Country of Publication:
United States
Language:
English

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