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Title: Inception of electronic damage of matter by photon-driven post-ionization mechanisms

Authors:
ORCiD logo [1];  [2];  [3];  [4];  [5];  [6];  [4];  [5]; ORCiD logo [4]; ORCiD logo [5]; ORCiD logo [5]; ORCiD logo [7]; ORCiD logo [3]
  1. Institute of Physical Chemistry, Polish Academy of Sciences, 01-224 Warsaw, Poland
  2. Physikalisch-Technische Bundesanstalt, 10587 Berlin, Germany
  3. Institute of Nuclear Physics, Polish Academy of Sciences, 31-342 Kraków, Poland
  4. Department of Chemistry–Ångström Laboratory, Uppsala University, 75120 Uppsala, Sweden
  5. Paul Scherrer Institute, CH-5232 Villigen-PSI, Switzerland
  6. Jozef Stefan Institute, SI-1000 Ljubljana, Slovenia
  7. Institute of Physical Chemistry, Polish Academy of Sciences, 01-224 Warsaw, Poland, Department of Chemistry–Ångström Laboratory, Uppsala University, 75120 Uppsala, Sweden
Publication Date:
Sponsoring Org.:
USDOE
OSTI Identifier:
1505255
Grant/Contract Number:  
AC02-76SF00515
Resource Type:
Journal Article: Publisher's Accepted Manuscript
Journal Name:
Structural Dynamics
Additional Journal Information:
Journal Name: Structural Dynamics Journal Volume: 6 Journal Issue: 2; Journal ID: ISSN 2329-7778
Publisher:
American Institute of Physics
Country of Publication:
United States
Language:
English

Citation Formats

Błachucki, W., Kayser, Y., Czapla-Masztafiak, J., Guo, M., Juranić, P., Kavčič, M., Källman, E., Knopp, G., Lundberg, M., Milne, C., Rehanek, J., Sá, J., and Szlachetko, J. Inception of electronic damage of matter by photon-driven post-ionization mechanisms. United States: N. p., 2019. Web. doi:10.1063/1.5090332.
Błachucki, W., Kayser, Y., Czapla-Masztafiak, J., Guo, M., Juranić, P., Kavčič, M., Källman, E., Knopp, G., Lundberg, M., Milne, C., Rehanek, J., Sá, J., & Szlachetko, J. Inception of electronic damage of matter by photon-driven post-ionization mechanisms. United States. doi:10.1063/1.5090332.
Błachucki, W., Kayser, Y., Czapla-Masztafiak, J., Guo, M., Juranić, P., Kavčič, M., Källman, E., Knopp, G., Lundberg, M., Milne, C., Rehanek, J., Sá, J., and Szlachetko, J. Fri . "Inception of electronic damage of matter by photon-driven post-ionization mechanisms". United States. doi:10.1063/1.5090332.
@article{osti_1505255,
title = {Inception of electronic damage of matter by photon-driven post-ionization mechanisms},
author = {Błachucki, W. and Kayser, Y. and Czapla-Masztafiak, J. and Guo, M. and Juranić, P. and Kavčič, M. and Källman, E. and Knopp, G. and Lundberg, M. and Milne, C. and Rehanek, J. and Sá, J. and Szlachetko, J.},
abstractNote = {},
doi = {10.1063/1.5090332},
journal = {Structural Dynamics},
issn = {2329-7778},
number = 2,
volume = 6,
place = {United States},
year = {2019},
month = {3}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record at 10.1063/1.5090332

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Works referenced in this record:

Room temperature femtosecond X-ray diffraction of photosystem II microcrystals
journal, June 2012

  • Kern, J.; Alonso-Mori, R.; Hellmich, J.
  • Proceedings of the National Academy of Sciences, Vol. 109, Issue 25, p. 9721-9726
  • DOI: 10.1073/pnas.1204598109

Femtosecond X-ray protein nanocrystallography
journal, February 2011

  • Chapman, Henry N.; Fromme, Petra; Barty, Anton
  • Nature, Vol. 470, Issue 7332, p. 73-77
  • DOI: 10.1038/nature09750