Optimizing the UED beam line design via ImpactT simulation
- Brookhaven National Lab. (BNL), Upton, NY (United States). Photon Sciences Directorate
The high charge low energy compressor system developed at NSLS-II can generate 5MeV electron bunches with 50pC charge (10-8 electrons) focusing to 30 micron beam size and bunch length of order of 100 fs. NSLS-II plans to build it as part of the existing instrument for the ultra-fast electron diffraction (UED) and ultra-fast electron microscope (UEM) experiments to be installed at ATF-II, BNL. The expected intensity will be several orders of magnitudes higher than achieved previously using current technology (~10-4-10-5 electrons). This type of accelerator based MeV electron microscopes, taking advantage of strong interaction of electrons with matter and overcoming space charge problem, are complementary to XFEL, such as LCLS.
- Research Organization:
- Brookhaven National Lab. (BNL), Upton, NY (United States)
- Sponsoring Organization:
- USDOE Office of Science (SC), Basic Energy Sciences (BES)
- DOE Contract Number:
- SC0012704
- OSTI ID:
- 1504390
- Report Number(s):
- NSLSII-ASD-TN-264; BNL-211203-2019-TECH
- Country of Publication:
- United States
- Language:
- English
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