X-ray backlighter requirements for refraction-based electron density diagnostics through Talbot-Lau deflectometry

Valdivia, Maria Pia; Veloso, Felipe; Stutman, Dan; Stoeckl, Christian; Mileham, Chad; Begishev, Ildar A.; Theobald, Wolfgang; Vescovi, Milenko; Useche, Wilmer; Regan, Sean P.; Albertazzi, Bruno; Rigon, Gabriel; Mabey, Paul; Michel, Thibault; Pikuz, Sergey A.; Koenig, Michel; Casner, Alexis

doi:10.1063/1.5039342

Title: X-ray backlighter requirements for refraction-based electron density diagnostics through Talbot-Lau deflectometry

Journal Article · Thu Oct 25 00:00:00 EDT 2018 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.5039342· OSTI ID:1502138

Valdivia, Maria Pia ^[1]; Veloso, Felipe ^[2]; Stutman, Dan ^[1]; Stoeckl, Christian ^[3]; Mileham, Chad ^[3]; Begishev, Ildar A. ^[3]; Theobald, Wolfgang ^[3]; Vescovi, Milenko ^[2]; Useche, Wilmer ^[2]; Regan, Sean P. ^[3]; Albertazzi, Bruno ^[4]; Rigon, Gabriel ^[4]; Mabey, Paul ^[4]; Michel, Thibault ^[4]; Pikuz, Sergey A. ^[5]; Koenig, Michel ^[4]; Casner, Alexis ^[6]

Johns Hopkins Univ., Baltimore, MD (United States)
Pontificia Universidad Católica de Chile, Santiago (Chile)
Univ. of Rochester, NY (United States)
CNRS CEA, Ecole Polytechnique (France)
Russian Academy of Sciences, Moscow (Russia)
Université de Bordeaux-CNRS-CEA, CELIA, Talence (France)

We report that Talbot-Lau x-ray interferometers can map electron density gradients in High Energy Density (HED) samples. In the deflectometer configuration, it can provide refraction, attenuation, elemental composition, and scatter information from a single image. X-ray backlighters in Talbot-Lau deflectometry must meet specific requirements regarding source size and x-ray spectra, amongst others, to accurately diagnose a wide range of HED experiments. 8 keV sources produced in the high-power laser and pulsed power environment were evaluated as x-ray backlighters for Talbot-Lau x-ray deflectometry. In high-power laser experiments, K-shell emission was produced by irradiating copper targets (500 × 500 × 12.5 μm³ foils, 20 μm diameter wire, and >10 μm diameter spheres) with 30 J, 8-30 ps laser pulses and a 25 μm copper wire with a 60 J, 10 ps laser pulse. In the pulsed power environment, single (2 × 40 μm) and double (4 × 25 μm) copper x-pinches were driven at ~1 kA/ns. Lastly, moiré fringe formation was demonstrated for all x-ray sources explored, and detector performance was evaluated for x-ray films, x-ray CCDs, and imaging plates in context of spatial resolution, x-ray emission, and fringe contrast.

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Research Organization:: Johns Hopkins Univ., Baltimore, MD (United States)

Sponsoring Organization:: USDOE National Nuclear Security Administration (NNSA)

Grant/Contract Number:: NA0002955

OSTI ID:: 1502138

Alternate ID(s):: OSTI ID: 1479133

Journal Information:: Review of Scientific Instruments, Vol. 89, Issue 10; ISSN 0034-6748

Publisher:: American Institute of Physics (AIP)Copyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 12 works

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Characterization of high spatial resolution lithium fluoride X-ray detectors Mabey, P.; Albertazzi, B.; Michel, Th. Review of Scientific Instruments, Vol. 90, Issue 6 https://doi.org/10.1063/1.5092265	journal	June 2019

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