Composition of Uranium Oxide Surface Layers Analyzed by m-Raman Spectroscopy

Conference · Mon Nov 24 00:00:00 EST 2003

DOI:https://doi.org/10.1557/PROC-802-DD5.10· OSTI ID:15013640

Siekhaus, W J

Oxide thickness and composition averaged over a few square millimeter has been measured with nm thickness resolution by diffuse reflectance fourier transform infrared (FTIR) spectroscopy. {mu}-Raman spectroscopy has been done on powders and bulk samples in the past, and can now be done on surfaces layers with {micro}m lateral and depth resolution using con-focal microscopy. Here we apply con-focal-microscopy-based {mu}-Raman spectroscopy to a freshly polished/lightly oxidized and to heavily oxidized uranium to determine its sensitivity. The spectra show that {mu}-Raman spectroscopy does detect oxide thickness and oxide composition with high sensitivity.

• Research Organization: Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
• Sponsoring Organization: USDOE
• DOE Contract Number: W-7405-ENG-48
• OSTI ID: 15013640
• Report Number(s): UCRL-CONF-201179; TRN: US200604%%68
• Resource Relation: Journal Volume: 802; Conference: Presented at: MRS 2003 Fall Meeting, Boston, MA, United States, Dec 01 - Dec 05, 2003
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
37 INORGANIC
ORGANIC
PHYSICAL AND ANALYTICAL CHEMISTRY
MICROSCOPY
OXIDES
RESOLUTION
SENSITIVITY
SPECTRA
SPECTROSCOPY
THICKNESS
URANIUM
URANIUM OXIDES