Experimental Determination of Valence Band Maxima for SrTiO3, TiO2, and SrO and the Associated Valence Band Offsets with Si(001)
Abstract We address the issue of accurate determination of the energy at the top of the valence band for SrTiO₃(001) single crystals, as well as TiO₂(001) anatase and SrO epitaxial films. These measurements are of critical importance in determining valence band offsets for oxides in heterojunctions involving these materials. Three different methods are presented and compared: (1) fitting Gaussian broadened theoretical densities of states to x-ray excited valence band spectra, (2) finding the intersection of a regression line that spans the linear portion of the x-ray excited valence band leading edge with the background between the valence band maximum and the Fermi level, and, (3) determining the energy at which high-resolution ultraviolet photoemission intensity of the leading edge goes to zero. We find that method 1 is not reliable due to limitations in the accuracy of density functional theory when applied to these oxides. In contrast, methods 2 and 3 give physically reasonable results that are in good mutual agreement. The difference in VBM between method 1 and methods 2 & 3 is 0.4 – 0.6 eV, depending on the oxide. The true valence band maximum can be directly and accurately measured using methods 2 & 3 provided the experiment is carried out with adequate energy resolution. PACS numbers: 79.60.Jv a)Electronic mail: sa.chambers@pnl.gov
- Research Organization:
- Pacific Northwest National Laboratory (PNNL), Richland, WA (US), Environmental Molecular Sciences Laboratory (EMSL)
- Sponsoring Organization:
- USDOE
- DOE Contract Number:
- AC05-76RL01830
- OSTI ID:
- 15010002
- Report Number(s):
- PNNL-SA-39659; 6292; KC0203020; TRN: US200433%%418
- Journal Information:
- Journal of Vacuum Science and Technology B--Microelectronics and Nanometer Structures, 22(4):2205-2215, Vol. 22, Issue 4
- Country of Publication:
- United States
- Language:
- English
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