Ion Beam Analysis of Interface Reactions in Magnetite and Maghemite Thin Films
We have investigated interface reactions between epitaxially-grown magnetite (FeO) and maghemite (gamma-FeO) films with MgO substrates using Rutherford backscattering (RBS), channeling, and x-ray diffraction(XRD). Annealing these films in 2.0x10 -6 Torr of oxygen at temperatures up to 970 K enhances Mg outdiffusion into the films and increases the film thickness depending on temperature. The magnetite film thickness reach a limiting value at 870 K anneal while the maghemite film thickness did not maximize after annealing at 970 K. After the annealing at 970 K, both films produced a compound with composition close to magnesioferrite (MgFeO). XRD results reveal the formation of magnesioferrite (MgFeO) films after annealing both films at 970 in oxygen.
- Research Organization:
- Pacific Northwest National Lab. (PNNL), Richland, WA (United States)
- Sponsoring Organization:
- USDOE
- DOE Contract Number:
- AC06-76RL01830
- OSTI ID:
- 15007508
- Report Number(s):
- PNNL-SA-32359
- Journal Information:
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms, 161-163(510-514, Journal Name: Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms, 161-163(510-514
- Country of Publication:
- United States
- Language:
- English
Similar Records
Rutherford backscattering and channeling studies of Al and Mg diffusion in iron oxide thin films
Rutherford Backscattering and Channeling Studies of Al and Mg Diffusion in Iron Oxide Thin Films