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Title: THIN DIAMOND FILMS FOR SNS H INJECTIONS STRIPPING.

Conference ·
OSTI ID:15007209

We have investigated the preparation and testing of thin diamond foils for use in stripping the SNS H{sup -} Linac beam. A long useful lifetime for these foils is desirable to improve operational efficiency. Preliminary data presented at PAC 2001 indicated that diamond foils were superior to conventional evaporated carbon foils, exhibiting lifetimes approximately five-fold longer [1]. That work employed a fully supported diamond foil, a format that is not acceptable for the SNS application; at least two edges of the approximately 1 x 1 cm foils must be free standing to allow for beam rastering. Residual stress in a chemical vapor deposited (CVD) diamond foil results in film distortion (scrolling) when the film is released from its silicon growth substrate. We have attacked this problem by initially patterning the surface of CVD growth substrates with a 50 or 100 line/inch trapezoidal grating, followed by conformal diamond film growth on the patterned substrate. Then removal of the substrate by chemical etching produced a foil that possessed improved mechanical integrity due to its corrugation. The high nucleation density required to grow continuous, pinhole free diamond foils of the desired thickness (1 {micro}m, 350 {micro}g/cm{sup 2}) was achieved by a combination of substrate surface scratching and seeding. A variety of diamond foils have been tested using the BNL 750 keV Radio Frequency Quadrupole H{sup -} beam to simulate energy loss in the SNS. Those include flat, corrugated, microcrystalline, and nanocrystalline foils. Foil lifetimes are reported.

Research Organization:
BROOKHAVEN NATIONAL LABORATORY (US)
Sponsoring Organization:
DOE/OFFICE OF SCIENCE (US)
DOE Contract Number:
AC02-98CH10886
OSTI ID:
15007209
Report Number(s):
BNL-72155-2004-CP; R&D Project: 86485; 39-KC-02-00; TRN: US0401466
Resource Relation:
Conference: PARTICLE ACCELERATOR CONFERENCE, PORTLAND, OR (US), 05/12/2003--05/16/2003; Other Information: PBD: 10 Mar 2004
Country of Publication:
United States
Language:
English