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Title: Detailed Study of Defects in Silicon Solar Cells by Cathodoluminescence Spectrum Imaging: Preprint

Abstract

We have recently developed a spectrum imaging system for cathodoluminescence (CLsi) at NREL, which has been successfully applied to different semiconductors. The advanced multi-channel detection required for CLsi consists of an ultrafast spectrum acquisition triggered by the electron beam during scanning. Spectra are acquired either with a Roper Scientific silicon EEV-1340400 cryogenic CCD or an InGaAs 5121 cryogenic PDA, depending on the range of spectral emission. Acquisition times by pixel are typically of 10 to 20 ms (180 seconds for a 100100 pixel image). The output of spectrum imaging measurements is thus represented by a series of emission spectra. CCDIMAG, the software developed for CLsi, processes this spectrum series to reconstruct monochromatic images or extract the spectrum from any area on the image. This system is operated on the JEOL-5800 scanning electron microscope (SEM). CLsi measurements can be performed at temperatures between 15 K and 300 K. A low-vibration ARS Displex DE-202 closed-circuit cryostat provides cryogenic operation. The interface for vibration isolation has been developed to be compatible with SEM observation.

Authors:
; ; ; ;
Publication Date:
Research Org.:
National Renewable Energy Lab. (NREL), Golden, CO (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
15004593
Report Number(s):
NREL/CP-520-34655
TRN: US201015%%749
DOE Contract Number:  
AC36-99-GO10337
Resource Type:
Conference
Resource Relation:
Conference: To be presented at the 13th Workshop on Crystalline Silicon Solar Cell Materials and Processes, 10-13 August 2003, Vail, Colorado
Country of Publication:
United States
Language:
English
Subject:
14 SOLAR ENERGY; 36 MATERIALS SCIENCE; CATHODOLUMINESCENCE; CRYOGENICS; CRYOSTATS; DEFECTS; DETECTION; ELECTRON BEAMS; ELECTRON MICROSCOPES; EMISSION SPECTRA; SILICON; SILICON SOLAR CELLS; SPECTRA; PHOTOVOLTAICS; SPECTRUM IMAGING SYSTEM; CATHODOLUMINESCENCE (CLSI); SCANNING ELECTRON MICROSCOPE (SEM); CLOSED-CIRCUIT CRYOSTAT; Solar Energy - Photovoltaics

Citation Formats

Romero, M J, Ostapenko, S, Al-Jassim, M M, Tarasov, I, and Sheldon, P. Detailed Study of Defects in Silicon Solar Cells by Cathodoluminescence Spectrum Imaging: Preprint. United States: N. p., 2003. Web.
Romero, M J, Ostapenko, S, Al-Jassim, M M, Tarasov, I, & Sheldon, P. Detailed Study of Defects in Silicon Solar Cells by Cathodoluminescence Spectrum Imaging: Preprint. United States.
Romero, M J, Ostapenko, S, Al-Jassim, M M, Tarasov, I, and Sheldon, P. Fri . "Detailed Study of Defects in Silicon Solar Cells by Cathodoluminescence Spectrum Imaging: Preprint". United States. https://www.osti.gov/servlets/purl/15004593.
@article{osti_15004593,
title = {Detailed Study of Defects in Silicon Solar Cells by Cathodoluminescence Spectrum Imaging: Preprint},
author = {Romero, M J and Ostapenko, S and Al-Jassim, M M and Tarasov, I and Sheldon, P},
abstractNote = {We have recently developed a spectrum imaging system for cathodoluminescence (CLsi) at NREL, which has been successfully applied to different semiconductors. The advanced multi-channel detection required for CLsi consists of an ultrafast spectrum acquisition triggered by the electron beam during scanning. Spectra are acquired either with a Roper Scientific silicon EEV-1340400 cryogenic CCD or an InGaAs 5121 cryogenic PDA, depending on the range of spectral emission. Acquisition times by pixel are typically of 10 to 20 ms (180 seconds for a 100100 pixel image). The output of spectrum imaging measurements is thus represented by a series of emission spectra. CCDIMAG, the software developed for CLsi, processes this spectrum series to reconstruct monochromatic images or extract the spectrum from any area on the image. This system is operated on the JEOL-5800 scanning electron microscope (SEM). CLsi measurements can be performed at temperatures between 15 K and 300 K. A low-vibration ARS Displex DE-202 closed-circuit cryostat provides cryogenic operation. The interface for vibration isolation has been developed to be compatible with SEM observation.},
doi = {},
url = {https://www.osti.gov/biblio/15004593}, journal = {},
number = ,
volume = ,
place = {United States},
year = {2003},
month = {8}
}

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