Time resolved x-ray diffraction study of laser annealing in silicon at grazing incidence.
Journal Article
·
· Journal of Applied Physics
No abstract prepared.
- Research Organization:
- Advanced Photon Source, Argonne National Lab., IL (US); Purdue Univ.; Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States); Cornell Univ. (US)
- Sponsoring Organization:
- US Department of Energy (US)
- OSTI ID:
- 15003321
- Journal Information:
- Journal of Applied Physics, Vol. 66, Issue 8; Other Information: PBD: 15 Oct 1989; Related Information: Oct. 15, 1989; ISSN 0021-8979
- Country of Publication:
- United States
- Language:
- English
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