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Title: Improvements in the accuracy and the repeatability of long trace profiler measurements.

Journal Article · · Applied Optics
DOI:https://doi.org/10.1364/AO.38.005468· OSTI ID:15002908

No abstract prepared.

Research Organization:
Advanced Photon Source, Argonne National Lab., IL (US); Brookhaven National Lab. (BNL), Upton, NY (United States); LBL (US)
Sponsoring Organization:
US Department of Energy (US)
DOE Contract Number:
W-31-109-ENG-38
OSTI ID:
15002908
Journal Information:
Applied Optics, Vol. 38, Issue 25; Other Information: PBD: 1 Sep 1999; Related Information: Sep. 1, 1999
Country of Publication:
United States
Language:
English

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